Back to results
US 7,443,184 B2Granted
Apparatus and methods for self-heating burn-in processes
AssigneeIntel Corporation
InventorJeffrey M. Norris
Life of this patent
Estimating the term…
Abstract
A method includes installing a device under test (DUT) into each of a plurality of burn-in boards. The method further includes docking each of the burn-in boards to a respective docking location, each of the burn-in boards with a single respective DUT installed therein. The method further includes subjecting the DUTs to a self-heating burn-in procedure while the burn-in boards are docked to the docking locations. Other embodiments are described and claimed.
Claims4
A method comprising:
- applying a burn-in procedure to a device under test (DUT) at a burn-in station;
- receiving a first signal from the DUT, said first signal indicating that an internal temperature of the DUT exceeds a first threshold temperature;
- receiving a second signal from the DUT, said second signal indicating that the internal temperature of the DUT exceeds a second threshold temperature that is higher than the first threshold temperature;
- during the burn-in procedure, controlling a fan at the burn-in station in response to said first signal;
- and
- during the burn-in procedure, controlling a source of power for the DUT in response to said second signal.
3 more elements
Dependencies are inferred from the claim text.