Zero motion contact actuation
AssigneeElectro Scientific Industries, Inc.
InventorMark Kosmowski
Life of this patent
Estimating the term…
Abstract
A device for testing small electronic components includes a test plate for moving a plurality of spaced electronic components to a test station. A roller is designed to press on the test plate and electronic component exerting a first force between 10-20 grams when the test plate and electronic component are moving and exerting a second force of about 50 grams when the test plate is stopped and the electronic component is aligned in the test station. The forces exerted on the test plate and electronic component are controlled by a force-application actuator, such as fluid operated actuator, for example a pneumatic actuator or a solenoid.
Claims20
In an apparatus for testing electronic components supported on a test plate for transport along a path of travel through a test station, the improvement comprising;
- a contact roller located at a test station for rolling along a surface of the test plate and at least one electronic component transported to the test station by the test plate for testing;
- and
- an incremental force-application actuator operable in a first mode to exert a first predetermined force through the contact roller on the test plate and supported electronic component while the test plate is moving, and operable in a second mode to exert a second predetermined force through the contact roller on the electronic component while the electronic component is stationary during testing at the test station.
In a method for testing at least one electronic component supported by a test plate for transport along a path of travel through a test station, a contact roller located at the test station for contacting the electronic component during testing, the improvement comprising:
- continuously maintaining the contact roller in contact with at least one of the test plate and the supported electronic component;
- exerting a first predetermined force with the contact roller on at least one of the test plate and the electronic component while the test plate is moving;
- and
- exerting a second predetermined force, greater than the first predetermined force, with the contact roller on the electronic component only when the electronic component is stationary at the test station.
A method for testing electronic components transported with a movable test plate to a test station comprising:
- exerting a first predetermined force with a contact roller against a test plate during movement of the test plate along a path of travel through a test station, at least one electronic component supported by the test plate for transport along the path of travel through the test station;
- and
- exerting a second predetermined force, greater than the first predetermined force, with the contact roller against a stationary electronic component supported by the test plate during testing of the stationary electronic component positioned at the test station by the test plate.
Dependencies are inferred from the claim text.