Minimizing number of masks to be changed when changing existing connectivity in an integrated circuit
AssigneeTexas Instruments Incorporated
InventorRaja Selvaraj
Life of this patent
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Abstract
Dummy stacks, each providing a common point of connectivity potentially across all metal layers, are incorporated along with the functional block in an integrated circuit. When the connectivity of elements of the functional block need to be changed later, the dummy stacks enable masks, which would otherwise need to be redesigned, to be further redesigned to obtain the desired connectivity. As a result, the redesign of some of the other masks, may be avoided, thereby reducing the total number of masks which would need to be redesigned while effecting a change in the connectivity of elements in a functional block.
Claims4
An integrated circuit providing a desired operation, said integrated circuit comprising:
- a pattern of connections within metal layers, vias between metal layers, and vias to circuit devices providing said desired operation;
- and
- a plurality of dummy stacks along with said pattern of connections and vias, said plurality of dummy stacks providing a point of common connectivity on a plurality of metal layers forming said integrated circuit, wherein at least one dummy stack avoids redesign of at least one mask of said integrated circuit.
Dependencies are inferred from the claim text.