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US 7,442,938 B2Granted
X-ray detector fabrication methods and apparatus therefrom
AssigneeGeneral Electric Company
InventorsHaochuan Jiang, David Michael Hoffman
Life of this patent
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Abstract
A detector includes a reflector and a scintillator in optical communication with the reflector, wherein both the reflector and the scintillator are fabricated from the same material.
Claims9
A detector comprising:
- a reflector;
- and
- a scintillator in optical communication with said reflector, both said reflector and said scintillator are fabricated from the same material wherein said material is milled to a sub micron size, and comprises at least one of Y—Gd—Eu—O:Pr, Gd—S—O—Ce—Tb, and Lu—Tb—Al—O:Ce.
A method comprising:
- creating a compound comprising at least one of Y—Gd—Eu—O:Pr, Gd—S—O—Ce—Tb, and Lu—Tb—Al—O:Ce, wherein said compound is milled to a sub micron size;
- using the compound both as a scintillator and as a reflector;
- and
- applying an optical reflector film to a top reflector surface.
1 more element
A CT system comprising:
- an x-ray source configured to emit x-rays;
- an x-ray detector positioned to receive x-rays emitted by said source;
- and
- a computer operationally coupled to said source and detector, said detector comprising a reflector and a scintillator in optical communication with said reflector, both said reflector and said scintillator are fabricated from the same material wherein said material is milled to a sub micron size, and comprising at least one of Y1.33Gd0.66Eu0.01O3:Pr, Gd2(S,O)2:Ce,Tb, and Lu0.8Tb2.2Al5O12:Ce.
1 more element
Dependencies are inferred from the claim text.