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US 7,442,927 B2Granted
Scanning ion probe systems and methods of use thereof
AssigneeGeorgia Tech Research Corporation
InventorAndrei G. Fedorov
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Abstract
Briefly described, embodiments of this disclosure, among others, include scanning ion probe systems, methods of use thereof, scanning ion source systems, methods of use thereof, scanning ion probe mass spectrometry systems, methods of use thereof, methods of simultaneous ion analysis and imaging, and methods of simultaneous mass spectrometry and imaging.
Claims20
A scanning ion source system, comprising:
- a scanning ion probe;
- and an ion generation chamber including a membrane disposed at a first end of the ion generation chamber and chamber walls interfaced with the membrane, wherein the membrane includes a plurality of orifices through the membrane, and wherein the base of the scanning ion probe is disposed adjacent the membrane.
A scanning ion probe system, comprising:
- an array of scanning ion sources, wherein each scanning ion source includes:
- a scanning ion probe;
- and
- an ion generation chamber including a membrane disposed at a first end of the ion generation chamber and chamber walls interfaced with the membrane, wherein the membrane includes a plurality of orifices through the membrane, and wherein the base of the scanning ion probe is disposed adjacent the membrane.
1 more element
Dependencies are inferred from the claim text.