Method for processing IC designs for different metal BEOL processes
AssigneeChartered Semiconductor Manufacturing Ltd.
InventorsJiannong Su, Simon Shi-ning Yang, Jian Zhang
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AssigneeChartered Semiconductor Manufacturing Ltd.
InventorsJiannong Su, Simon Shi-ning Yang, Jian Zhang
Estimating the term…
A method for processing IC designs for different metal BEOL processes is provided for enabling fabricating using a metal fabrication process an IC originally having a backend design for a different metal fabrication process. The method first determines layer constructions of an original design of an IC for a first metal backend process, and, based on the layer constructions of the original design of the IC, constructs primitive layer constructions of a target design of the IC for a second metal backend process. The method then tunes an effective dielectric constant of a dielectric layer of the target design to match an associated capacitance of the target backend design with a corresponding capacitance of the original backend design. The method can be used to convert a backend design of an IC from an old metal process (such as Al process) to a new metal process (such as Cu process), without redesigning the IC for the new metal BEOL fabrication process.
A method for processing IC designs for different metal BEOL processes, the method comprising:
A method for converting a backend design of an IC from one metal process to another metal process, the method comprising:
A process for using Cu BEOL to fabricate an integrated circuit (IC) originally having an Al backend design, the process comprising:
Dependencies are inferred from the claim text.