US 7,423,268 B2 · Projection imaging type electron microscope

Abstract

It is an object of the present invention to provide an projection imaging type electron microscope in which the imposition of restrictions on the design of the illumination electron optical system by the conditions of the projection electron optical system is alleviated, so that the degree of freedom in the design of the illumination electron optical system is increased. Generated electrons 6b (principal rays) emitted from the sample 5 parallel to the optical axis are focused by a cathode lens so that these electrons cross the optical axis 3 at one point. This point is the first crossover. The generated electrons 6b are oriented parallel to the optical axis by the cathode lens 4a, and are focused as an image at the position of the electromagnetic prism 2; these electrons pass through the stigmator 7, and are incident on the relay lens 8a. These electrons are again focused, and cross the optical axis 3 at one point. This position is the second crossover. An aperture diaphragm 11 is disposed in this second crossover position. As a result, the need to install an aperture diaphragm in the first crossover position is eliminated, so that design of the illumination electron optical system is facilitated.

Claims10

Dependent claims

A projection imaging electron microscope, comprising:

an electron beam source for illuminating a sample surface of a sample with an electron beam to generate a signal electron beam from the sample;
and
a projection image focusing optical system for forming an image of the sample surface on a detection surface of a detector, the projection image focusing optical system comprising an electromagnetic prism to direct the signal electron beam, a zoom lens, and a relay optical system provided between the zoom lens and the electromagnetic prism;
wherein an aperture diaphragm, which determines an opening angle of the projection image focusing optical system, is disposed inside of the relay optical system and at a position of a second crossover of the signal electron beam in the projection image focusing optical system as counted from the sample surface.

1 more element

A projection imaging electron microscope in which a sample surface is observed, comprising:

an electron beam source that emits an illuminating electron beam;
an electromagnetic prism;
an illumination electron optical system that causes the illuminating electron beam to be incident on the electromagnetic prism;
an objective electron optical system that illuminates the sample surface with the illuminating electron beam that passes through the electromagnetic prism;
a detector;
and
an image-forming electron optical system which conducts a signal electron beam of electrons that pass from the sample surface through the electromagnetic prism to the detector, and which images a first intermediate image of the sample surface on a detection surface of the detector, the image-forming electron optical system comprising a zoom lens, and a relay optical system provided between the zoom lens and the electromagnetic prism;
wherein the sample surface is illuminated with the illuminating electron beam by Koehler illumination, and the objective electron optical system is an object-side telecentric optical system;
and
wherein in a projection image focusing optical system, which includes the objective electron optical system, the electromagnetic prism and the image-forming optical system, and which forms an image of the sample surface on the detection surface of the detector, an aperture diaphragm, which determines an opening angle of the projection image focusing optical system, is disposed inside the relay optical system and at a position of a second crossover of the signal electron beam in the projection image focusing optical system as counted from the sample surface.

7 more elements

Dependencies are inferred from the claim text.

Projection imaging type electron microscope

Life of this patent

Projection imaging type electron microscope

Life of this patent

Abstract

Claims10