# US 7,412,334 B2 · Mass spectrometer and method for enhancing resolution of mass spectra

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- Number: US 7,412,334 B2
- Document ID: US7412334B2
- Status: Granted
- Kind: B2
- Application number: 11/412,887
- Filed: 2006-04-27
- Published: 2007-11-01
- Granted: 2008-08-12
- Earliest claimed: 2006-04-27
- Assignees: Agilent Technologies, Inc.
- Inventors: John Christian Fjeldsted; August Jon Hidalgo; William Daniel Frazer
- Web page: https://patentgrep.com/patent/US7412334B2

## CPC

- H01J 49/0036: {Step by step routines describing the handling of the data generated during a measurement}
- H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H)

## Abstract

A mass spectrometer comprises an ion detector, an analog-to-digital (A/D) converter, a sample adjuster, and an adder. The A/D converter is configured to receive and sample an analog signal from the ion detector thereby providing a plurality of samples. The adder is configured to sum the samples, and the summed samples define a mass spectrum. The sample adjuster is configured to identify a peak defined by the samples and to suppress at least one of the samples of the peak such that a resolution of a peak within the mass spectrum is enhanced.

## Claims

### Claim 1

A mass spectrometer, comprising:
an ion detector;
an analog-to-digital (A/D) convener configured to receive and sample an analog signal from the ion detector thereby providing a plurality of samples;
a sample adjuster configured to:
identify a peak defined by the samples;
identify to remain unsuppressed at least one of said samples defining said identified peak; and
suppress at least one of said samples defining said peak except for at least one of said identified at least one of said samples; and
an adder configured to sum the samples, wherein the summed samples define a mass spectrum and include a result of summing the at least one sample adjusted by the sample adjuster with a running sum of other ones of the samples.

### Claim 2 (depends on 1)

The mass spectrometer of claim 1, wherein the sample adjuster is configured to adjust the at least one sample based on a comparison of the at least one sample to another sample of the identified peak.

### Claim 3 (depends on 1)

The mass spectrometer of claim 1, wherein the sample adjuster is configured to make a determination as to whether the at least one sample is a maximum sample for the identified peak and to adjust the at least one sample based on the determination.

### Claim 4 (depends on 1)

The mass spectrometer of claim 1, wherein the sample adjuster is configured to identify a maximum sample for the identified peak and to transmit the maximum sample to the adder without adjusting the maximum sample.

### Claim 5 (depends on 1)

The mass spectrometer of claim 1, wherein the sample adjuster is configured to adjust the at least one sample based on the identified peak by assigning a value of zero to the at least one sample.

### Claim 6 (depends on 1)

The mass spectrometer of claim 1, wherein the sample adjuster is configured to allow a predefined number of samples of the identified peak to pass unsuppressed through the sample adjuster and to suppress each of the other samples of the identified peak such that a resolution of a peak of the mass spectrum is enhanced.

### Claim 7

A mass spectrometer, comprising:
an ion detector;
an analog-to-digital (A/D) convener configured to receive and sample an analog signal from the ion detector thereby providing a plurality of samples;
an adder configured to sum the samples, wherein the summed samples define a mass spectrum;
and a sample adjuster configured to:
identify a peak defined by the samples;
identify to remain unsuppressed at least one of said samples defining said identified peak; and
suppress at least one of said samples defining said peak except for at least one of said identified at least one of said samples such that a resolution of a peak within the mass spectrum is enhanced.

### Claim 8 (depends on 7)

The mass spectrometer of claim 7, wherein the sample adjuster is configured to suppress the at least one sample based on a comparison of the at least one sample to another sample of the identified peak.

### Claim 9 (depends on 7)

The mass spectrometer of claim 7, wherein the sample adjuster is configured to make a determination as to whether the at least one sample is a maximum sample for the identified peak and to suppress the at least one sample based on the determination.

### Claim 10 (depends on 7)

The mass spectrometer of claim 7, wherein the sample adjuster is configured to identify a maximum sample for the identified peak and to transmit the maximum sample to the adder without suppressing the maximum sample.

### Claim 11 (depends on 7)

The mass spectrometer of claim 7, wherein the sample adjuster is configured to select a predefined number of samples of the identified peak and to suppress each of the non-selected samples of the identified peak.

### Claim 12

A method for generating mass spectra, comprising:
detecting ions;
transmitting an analog signal indicative of the detecting; sampling the analog signal thereby providing a plurality of samples;
identifying a peak defined by the samples;
identifying to remain unsuppressed at least one of said samples defining said identified peak;
summing the samples thereby defining a mass spectrum; and
suppressing at least one of said samples defining said peak except for at least one of said identified at least one of said samples such that a resolution of the mass spectrum is enhanced.

### Claim 13 (depends on 12)

The method of claim 12, further comprising comparing the at least one sample to another sample of the identified peak, wherein the suppressing is based on the comparing.

### Claim 14 (depends on 12)

The method of claim 12, further comprising identifying a maximum sample of the identified peak, wherein the suppressing is based on the identifying a maximum sample.

### Claim 15 (depends on 12)

The method of claim 12, further comprising comparing samples of the identified peak and selecting a predefined number of samples of the identified peak based on the comparing, wherein the suppressing comprises suppressing, based on the selecting, each of the non-selected samples of the identified peak.

### Claim 16

A method for generating mass spectra, comprising:
detecting ions;
transmitting an analog signal indicative of the detecting;
sampling the analog signal thereby providing a plurality of samples;
identifying a peak defined by the samples; summing the samples thereby defining a mass spectrum;
identifying to remain unsuppressed at least one of said samples defining said identified peak; and
and enhancing a resolution of a peak of the mass spectrum, wherein the enhancing comprises preventing, based on the identifying, at least one of the samples defining the identified peak from affecting the mass spectrum by suppressing at least one of said samples defining said peak except for at least one of said identified at least one of said samples.

### Claim 17 (depends on 16)

The method of claim 16, further comprising comparing the at least one sample to another sample of the identified peak, wherein the preventing is based on the comparing.

### Claim 18 (depends on 16)

The method of claim 16, further comprising determining whether the at least one sample is a maximum sample for the identified peak, wherein the preventing is based on the determining.

### Claim 19 (depends on 16)

The method of claim 16, wherein the preventing comprises assigning a value of zero to the at least one sample.

### Claim 20 (depends on 16)

The method of claim 16, further comprising comparing samples of the identified peak and selecting a predefined number of samples of the identified peak based on the comparing, wherein the preventing comprises suppressing, based on the selecting, each of the non-selected samples of the identified peak.
