# US 7,411,384 B2 · Wafer chuck

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- Number: US 7,411,384 B2
- Document ID: US7411384B2
- Status: Granted
- Kind: B2
- Application number: 11/682,703
- Filed: 2007-03-06
- Published: 2007-07-05
- Granted: 2008-08-12
- Earliest claimed: 2004-09-06
- Assignees: Tokyo Electron Limited
- Inventors: Ikuo Ogasawara; Yoshiyasu Kato
- Web page: https://patentgrep.com/patent/US7411384B2

## CPC

- H10P 72/7612: {characterised by lifting arrangements, e.g. lift pins}
- G01R 31/2886: {Features relating to contacting the IC under test, e.g. probe heads; chucks (G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06)}
- G01R 31/2893: {Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H10P72/00)}
- H10P: GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A wafer chuck is provided with a plurality of pins which protrude and retreat in a plurality of through holes formed in a vertical direction on a mounting table, and an ascending/descending mechanism for ascending and descending the pins. The wafer chuck receives a wafer by protruding the pins from the mounting plane of the mounting table. On each upper end surface of the pin, a receiving surface part is provided for substantially not making a gap between the pin and each of the corresponding through holes and a mechanism for aligning the receiving surface part with the mounting surface is provided.

## Claims

### Claim 1

A wafer chuck comprising:
a plurality of pins, each of which protrudes and retreats via a through hole formed in a vertical direction in a mounting table, each of the pins including at a top end thereof a receiving surface part which virtually makes no gap between each of the pins and the through hole;
a joint member for supporting the pins;
an ascending/descending mechanism for ascending and descending the joint member to thereby protrude and retreat the pins, the wafer chuck being configured to receive or deliver a wafer by protruding the pins above a mounting surface of the mounting table; and
a mechanism for aligning the receiving surface part of each of the pins to be flush with the mounting surface, wherein the mechanism includes a supported surface part formed below the receiving surface part of each of the pins, a supporting part formed in the through hole to be contacted with the supported surface part, and a pressing arrangement for making the supported surface part constantly contact the supporting part, and
wherein the pressing arrangement includes a first pressing mechanism for biasing the joint member, and a second pressing mechanism provided at each of the pins for biasing each of the pins.

### Claim 2 (depends on 1)

The wafer chuck of claim 1, wherein the supporting part is formed of a stepped portion having a hole with a smaller diameter than that of an adjacent portion of the through hole, the stepped portion being provided to accommodate therein the receiving surface part of each of the pins.

### Claim 3 (depends on 1)

The wafer chuck of claim 1, wherein a part of each of the pins between the receiving surface part and the supported surface part has an upside-down truncated cone shape.

### Claim 4 (depends on 1)

The wafer chuck of claim 1, wherein each of the pins has a stopper ring fixed to an axis thereof, and the second pressing mechanism is adapted to press the stopper ring downwards.

### Claim 5 (depends on 1)

The wafer chuck of claim 1, wherein the second pressing mechanism is formed of a coil spring elastically provided in the through hole.

### Claim 6

A wafer chuck comprising:
a plurality of pins, each of which protrudes and retreats via a through hole formed in a vertical direction in a mounting table, each of the pins including at a top end thereof a receiving surface part which virtually makes no gap between each of the pins and the through hole;
a joint member for supporting the pins;
an ascending/descending mechanism for ascending and descending the joint member to thereby protrude and retreat the pins;
a mechanism for aligning the receiving surface part to be flush with the mounting surface, wherein the mechanism includes a supported surface part formed below the receiving surface part of each of the pins, a supporting part formed in the through hole to be contacted with the supported surface part, and a pressing arrangement for making the supported surface part constantly contact the supporting part; and
a number of cylinder mechanisms provided around the mounting table, each cylinder mechanism including a vertically moving receiving part, and the wafer chuck being configured to deliver and receive a wafer supported by a dicing frame by protruding the receiving part above the mounting surface of the mounting table, and
wherein the pressing arrangement includes a first pressing mechanism for biasing the joint member, and a second pressing mechanism formed at each of the pins for biasing each of the pins.

### Claim 7 (depends on 6)

The wafer chuck of claim 6, wherein the supporting part is formed of a stepped portion having a hole with a smaller diameter than that of an adjacent portion of the through hole, the stepped portion being provided to accommodate therein the receiving surface part of each of the pins.

### Claim 8 (depends on 6)

The wafer chuck of claim 6, wherein a part of each of the pins between the receiving surface part and the supported surface part has an upside-down truncated cone shape.

### Claim 9 (depends on 6)

The wafer chuck of claim 6, wherein each of the pins has a stopper ring fixed to an axis thereof, and the second pressing mechanism is adapted to press the stopper ring downwards.

### Claim 10 (depends on 6)

The wafer chuck of claim 6, wherein the second pressing mechanism is formed of a coil spring elastically provided in the through hole.
