Techniques for sensing temperature and automatic calibration on integrated circuits

A method for sending temperature on an integrated circuit, the method comprising:

• comparing a voltage across a diode with a voltage from a first transistor network using a comparator, the first transistor network comprising first transistors coupled in parallel and first resistors coupled in series with the first transistors;
• converting an output of the comparator into a plurality of digital signals;
• and
• selectively enabling the first transistors in the first transistor network in response to the plurality of digital signals.

An integrated circuit comprising:

• a comparator;
• an offset calibration circuit that generates a digital offset code in response to the output signal of the comparator;
• a first transistor network selectively enabling first transistors in response to the digital offset code;
• a logic circuit that generates second digital output signals in response to an output signal of the comparator;
• and
• a second transistor network selectively enabling second transistors in response to the second digital signals,
• wherein the comparator is coupled to receive a signal from the first and the second transistor networks, and states of second transistors in the second transistor network are held constant in response to a predefined digital code during an offset calibration mode.