Method and apparatus for nondestructive evaluation of insulative coating

A computer implemented nondestructive testing method for determining thickness and thermal conductivity for an insulative coating, the method comprising:

• obtaining a respective time-temperature response for the insulative coating and for a substrate from data representative of a propagation of a plurality of optical pulses in the insulative coating and the substrate, wherein the insulative coating is disposed on the substrate;
• measuring a deltalog value from the respective time-temperature responses;
• calculating a coating effusivity value from the deltalog value;
• calculating a thermal conductivity value from the coating effusivity value;
• calculating a reflectivity value from the deltalog value;
• determining a variable using the reflectivity value;
• measuring an inflection point value from the respective time-temperature response for the insulative coating and for the substrate;
• calculating a coating characteristic time using the inflection point value and the variable;
• calculating a thermal diffusivity value using the thermal conductivity value;
• determining a thickness value for the insulative coating from the thermal diffusivity value and the coating characteristic time;
• and
• outputting the thickness value and the thermal conductivity value to a computer display device or a printer or a combination thereof.

A computer implemented method for determining thickness and thermal conductivity for an insulative coating, the method comprising:

• obtaining a respective time-temperature response for the insulative coating and for a substrate, wherein the insulative coating is disposed on the substrate;
• measuring a deltalog value from the respective time-temperature responses;
• measuring an inflection point value from the respective time-temperature response for the insulative coating and for the substrate;
• calculating a plurality of coating characteristic values using the deltalog value or the inflection point value;
• determining a thermal conductivity value or a coating thickness value using one or more of the plurality of coating characteristic values;
• and
• outputting the thickness value and the thermal conductivity value to a computer display device or a printer or a combination thereof.

A tangible medium, comprising:

• code for obtaining a respective time-temperature response for an insulative coating and for a substrate, wherein the insulative coating is disposed on the substrate;
• code for measuring a deltalog value from the respective time-temperature responses;
• code for measuring an inflection point value from the respective time-temperature response for the insulative coating and for the substrate;
• code for calculating a plurality of coating characteristic values using the deltalog value or the inflection point value;
• code for determining a thermal conductivity value or a coating thickness value using one or more of the plurality of coating characteristic values;
• and
• code for outputting the thickness value and the thermal conductivity value to a computer display device or a printer or a combination thereof,
• wherein the tangible medium is configured for determining thickness and thermal conductivity for the insulative coating, and wherein the tangible medium is a computer-readable medium.

An apparatus for determining thickness and thermal conductivity for an insulative coating disposed on a substrate of an object, the apparatus comprising:

• a source for applying a plurality of optical pulses on a surface of the object, wherein the surface comprises the insulative coating;
• a recording system configured to collect data representative of a propagation of the plurality of optical pulses in the object, wherein the data comprises time-temperature responses;
• and
• a processor coupled to the recording system and configured to receive the data from the recording system, the processor configured to determine a reflectivity value and a coating characteristic time using time-temperature responses,
• wherein the processor is configured to determine a thickness value and a thermal conductivity value for the insulative coating using the reflectivity value and the coating characteristic time.

An apparatus for determining thickness and thermal conductivity for an insulative coating disposed on a substrate of an object, the apparatus comprising:

• a source for applying a plurality of optical pulses on a surface of the object, wherein the surface comprises the insulative coating;
• a recording system configured to collect data representative of a propagation of the plurality of optical pulses in the object, wherein the data comprises time-temperature responses;
• and
• a processor coupled to the recording system and configured to receive the data from the recording system, the processor configured to determine a reflectivity value and a coating characteristic time using time-temperature responses,
• wherein the processor is configured to measure a deltalog value and an inflection point value from the respective time-temperature response.

A computer implemented nondestructive testing method for determining thickness and thermal conductivity for an insulative coating, the method comprising:

• obtaining a respective time-temperature response for the insulative coating and for a substrate from data representative of a propagation of a plurality of optical pulses in the insulative coating and the substrate, wherein the insulative coating is disposed on the substrate;
• measuring a deltalog value, an inflection point value, or a combination thereof, from the respective time-temperature responses;
• calculating a coating effusivity value, or a coating characteristic time, or a combination thereof;
• calculating a thermal conductivity value using the respective time-temperature response for the insulative coating and for the substrate;
• calculating a thermal diffusivity value using the thermal conductivity value;
• determining a thickness value for the insulative coating using the thermal diffusivity value;
• and
• outputting the thickness value and the thermal conductivity value to a computer display device, or a printer, or a combination thereof.

A computer implemented method for determining thickness and thermal conductivity for an insulative coating, the method comprising:

• obtaining a respective time-temperature response for the insulative coating and for a substrate, wherein the insulative coating is disposed on the substrate;
• calculating a plurality of coating characteristic values using the respective time-temperature response for the insulative coating and for the substrate;
• determining a thermal conductivity value and a coating thickness value using one or more of the plurality of coating characteristic values, wherein the coating characteristic values are based on a deltalog value, an inflection point value, or a combination thereof;
• and
• outputting the thermal conductivity value and the coating thickness value to a computer display device, or a printer, or a combination thereof.

An apparatus for determining thickness and thermal conductivity for an insulative coating disposed on a substrate of an object, the apparatus comprising:

• a heat source configured for heating a surface of the object, wherein the surface comprises the insulative coating;
• a recording system configured to collect data representative of a propagation of a plurality of thermal pulses in the object, wherein the data comprises time-temperature responses;
• and
• a processor coupled to the recording system and configured to use time-temperature responses to determine a thickness value and a thermal conductivity value for the insulative coating;
• wherein the processor is configured to measure a deltalog value, and an inflection point value, from respective time temperature responses.