# US 7,408,165 B2 · Detector arrangement

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- Number: US 7,408,165 B2
- Document ID: US7408165B2
- Status: Granted
- Kind: B2
- Application number: 10/525,472
- Filed: 2003-08-14
- Published: 2005-11-03
- Granted: 2008-08-05
- Earliest claimed: 2002-08-30
- Assignees: Koninklijke Philips Electronics N.V.
- Inventors: Michael Overdick; Matthias Simon
- Web page: https://patentgrep.com/patent/US7408165B2

## CPC

- H04N 25/00: Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N 23/30: for generating image signals from X-rays
- H04N 25/702: SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout
- H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION

## Abstract

The invention relates to a detector arrangement for the conversion of electromagnetic radiation into electrical signals. The detector arrangement includes sensitive areas (D1, D2, D3, D4), where each sensitive area corresponds to a respective electrical signal, and at least two of the sensitive areas mesh with one another in such a manner that non-overlapping envelopes (C1, C2, C3, C4) of the individual meshing sensitive areas also mesh with one another.

## Claims

### Claim 1

A detector arrangement for the conversion of electromagnetic radiation into electrical signals, which arrangement includes sensitive areas, each of which corresponds to a respective electrical signal, wherein at least two of the sensitive areas mesh with one another by positioning a portion of one of the sensitive areas in a fully enclosed free area of another one of the sensitive areas.

### Claim 2 (depends on 1)

A detector arrangement as claimed in claim 1, wherein at least two of the sensitive areas mesh with one another by at least one of interleaving and dentation.

### Claim 3 (depends on 1)

A detector arrangement as claimed in claim 1, wherein sampling properties of the sensitive areas are defined by a respective associated sensitive surface and that meshing is realized by way of the sensitive surfaces.

### Claim 4 (depends on 1)

A detector arrangement as claimed in claim 1, wherein the sensitive areas are formed by at least one of photodiodes or electrodes.

### Claim 5 (depends on 1)

A detector arrangement as claimed in claim 1, wherein at least a portion of each the sensitive areas overlaps a portion of another sensitive area.

### Claim 6 (depends on 1)

A detector arrangement as claimed in claim 1, wherein the shape of the sensitive areas varies.

### Claim 7 (depends on 1)

An imaging X-ray system which includes a detector arrangement as claimed in claim 1.

### Claim 8 (depends on 1)

The detector arrangement of claim 1, wherein at least a portion of each the sensitive areas overlaps a portion of another sensitive area.

### Claim 9 (depends on 1)

The detector arrangement of claim 1, wherein all of the sensitive areas mesh with one another by interleaving.

### Claim 10 (depends on 1)

The detector arrangement of claim 1, wherein each of the sensitive areas is symmetrical.

### Claim 11

A method for the conversion of electromagnetic radiation into electrical signals, which method comprises:
emission of electromagnetic radiation by a radiation source,
detection of the electromagnetic radiation by means of a detector arrangement which includes sensitive areas,
conversion of the electromagnetic radiation into electrical signals such that the sensitive areas of the detector arrangement correspond unambiguously to a respective electrical signal, wherein at least two of the sensitive areas mesh with one another so that a portion of one of the sensitive areas is positioned in a fully enclosed free area of another one of the sensitive areas, and
propagation of the electrical signals.

### Claim 12 (depends on 1)

The detector arrangement of claim 1, wherein the at least two of the sensitive areas that mesh with one another are connected to each other along a non-surface portion of the detector arrangement.

### Claim 13 (depends on 11)

The method of claim 11, wherein the at least two of the sensitive areas that mesh with one another are connected to each other along a non-surface portion of the detector arrangement.

### Claim 14 (depends on 11)

The method of claim 11, wherein the shape of the sensitive areas is the same.

### Claim 15 (depends on 11)

The method of claim 11, wherein all of the sensitive areas mesh with one another by interleaving.

### Claim 16 (depends on 11)

The method of claim 11, wherein each of the sensitive areas is symmetrical.