Testing of an integrated circuit having an embedded processor
AssigneeXilinx, Inc.
InventorsAhmad R. Ansari, Mehul R. Vashi, Nigel G. Herron, Stephen M. Douglass
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Abstract
Method and apparatus for generating a test program for an integrated circuit having an embedded processor. One embodiment has a system which includes an embedded microprocessor; a plurality of assembly language instructions stored in a memory, where the assembly language instructions substantially exercise a critical path or a path closest to the critical path in the embedded microprocessor; and programmable test circuitry having a programmable clock circuit for providing a multiplied clock signal to the embedded microprocessor in order to execute the assembly language instructions.
Claims11
A system for testing a portion of a processor block embedded in a programmable logic device, the portion comprising a data side memory controller and the system comprising:
- means for configuring programmable logic of the programmable logic device for forming a test bench;
- means for providing a clock signal to the test bench;
- means for initiating a test of the portion of the processor block;
- means for writing first information into controller registers of the memory controller;
- means for reading back the first information into first registers not of the memory controller;
- means for writing second information into the controller registers of the memory controller;
- means for reading back the second information into second registers not of the memory controller;
- and
- means for respectively comparing contents of the first registers to the first information;
- and
- means for respectively comparing contents of the second registers to the second information.
Dependencies are inferred from the claim text.