Measurement board for electronic device test apparatus
AssigneeAdvantest Corporation
InventorsHiroyuki Mineo, Atsunori Shibuya
Life of this patent
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AssigneeAdvantest Corporation
InventorsHiroyuki Mineo, Atsunori Shibuya
Estimating the term…
A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal leakage to the outside and entry of noise, provided with a base board having a signal pattern electrically connected with a socket formed on its front surface, a coaxial connector to which a coaxial cable electrically connecting the performance board and test apparatus is connected, passing through the base board from the back surface toward the front surface, and having a front exposed part of the center contact bent and electrically connected to the signal pattern, and a cover member covering the front exposed part of the center contact and correcting the impedance of the front exposed part.
A measurement board for electrically connecting an electronic device under test and a test apparatus, comprising:
Dependencies are inferred from the claim text.