Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics

A method for measuring high-frequency characteristics of an electronic device, the method comprising the steps of:

• preparing a transmission line whose electrical characteristics per unit length are unknown, the transmission line including a signal conductor and a ground conductor;
• connecting two ends of the transmission line to associated measurement ports of a measuring device;
• measuring, at least four points in the longitudinal direction of the transmission line, electrical characteristics in a connection state where the signal conductor is connected to the ground conductor;
• obtaining error factors of a measurement system including the transmission line and the electrical characteristics of the transmission line on the basis of measured values in the connection state;
• shunt-connecting the electronic device to be measured to the transmission line and measuring electrical characteristics;
• and
• removing the error factors of the measurement system from measured values of the electronic device to be measured and thereby obtaining true values of the electrical characteristics of the electronic device to be measured.

An apparatus for measuring high-frequency characteristics of an electronic device, the apparatus comprising:

• a transmission line whose electrical characteristics per unit length are known, the transmission line including a signal conductor and a ground conductor;
• a measuring device that can measure high-frequency electrical characteristics, the measuring device including measurement ports connected to two ends of the signal conductor of the transmission line and a measurement port connected to the ground conductor;
• means for establishing a connection state where the signal conductor is connected to the ground conductor at least three points on the transmission line;
• means for obtaining error factors of a measurement system including the transmission line on the basis of measured values obtained by the measuring device in the connection state and the electrical characteristics of the transmission line;
• means for shunt-connecting the electronic device to be measured to the transmission line;
• and
• means for removing the error factors of the measurement system from measured values obtained by the measuring device by shunt-connecting the electronic device to be measured to the transmission line and obtaining true values of the electrical characteristics of the electronic device to be measured.

An apparatus for measuring high-frequency characteristics of an electronic device, the apparatus comprising:

• a transmission line whose electrical characteristics per unit length are unknown, the transmission line including a signal conductor and a ground conductor;
• a measuring device that can measure high-frequency electrical characteristics, the measuring device including measurement ports connected to two ends of the signal conductor of the transmission line and a measurement port connected to the ground conductor;
• means for establishing a connection state where the signal conductor is connected to the ground conductor at least four points on the transmission line;
• means for obtaining error factors of a measurement system including the transmission line and the electrical characteristics of the transmission line on the basis of measured values obtained by the measuring device in the connection state;
• means for shunt-connecting the electronic device to be measured to the transmission line;
• and
• means for removing the error factors of the measurement system from measured values obtained by the measuring device by shunt-connecting the electronic device to be measured to the transmission line and obtaining true values of the electrical characteristics of the electronic device to be measured.

A method for calibrating an apparatus for measuring high-frequency electrical characteristics of an electronic device, the method comprising the steps of:

• preparing a high-frequency electrical characteristic measuring apparatus including a transmission line whose electrical characteristics per unit length are known, the transmission line including a signal conductor and a ground conductor, and both ends of the transmission line being connected to associated measurement ports of a measuring device;
• measuring, at least three points in the longitudinal direction of the transmission line, electrical characteristics in a connection state where the signal conductor is connected to the ground conductor;
• and
• obtaining error factors of a measurement system including the transmission line on the basis of measured values in the connection state and the electrical characteristics of the transmission line.

A method for calibrating an apparatus for measuring high-frequency electrical characteristics of an electronic device, the method comprising the steps of:

• preparing a high-frequency electrical characteristic measuring apparatus including a transmission line whose electrical characteristics per unit length are unknown, the transmission line including a signal conductor and a ground conductor, and both ends of the transmission line being connected to associated measurement ports of a measuring device;
• measuring, at least four points in the longitudinal direction of the transmission line, electrical characteristics in a connection state where the signal conductor is connected to the ground conductor;
• and
• obtaining error factors of a measurement system including the transmission line and the electrical characteristics of the transmission line on the basis of measured values in the connection state.