Sample handling mechanisms and methods for mass spectrometry

A sample support handling mechanism for a mass analyzer system having a vacuum lock chamber comprising:

• a sample support changing mechanism disposed in the vacuum lock chamber and a sample support transfer mechanism;
• the sample support transfer mechanism comprising:
• a base member having a substantially planar front face;
• a left arm and a right arm, each arm extending from the base member in a direction X substantially perpendicular to the front face, the left arm and right arm spaced apart from each other in a direction Y substantially parallel to the front face and spaced a distance sufficient to fit a sample support in a frame member between them;
• the left arm comprising a left bearing support structure and a retention projection extending from the left arm towards the right arm in the Y direction, and the right arm comprising a right bearing support structure and a retention projection extending from the right arm towards the left arm in the Y direction;
• the left and right bearing support structures configured in a first position to urge a back end of a sample support in a frame member into registration in a direction Z against the retention projections of the left and right arms, the direction Z being substantially perpendicular to both the X and Y directions;
• and
• an engagement member situated between the left arm and the right arm, the engagement member in a first position configured to urge a front end of a sample support in a frame member into registration with the front face of the base member and to urge the front end of the sample support in a frame member into registration in the direction Z against the retention projections of the left and right arms;
• the sample support changing mechanism comprising:
• a central cam structure disposed between a left cam structure and a right cam structure;
• a sample support loading region between the left cam structure and the central cam structure comprising:
• a first disengagement member capable of urging the engagement member to a second position;
• and
• a registration member capable of urging a sample's support in a frame member against the front face and the left arm;
• the left cam structure capable of slideably engaging the left arm bearing support structure to urge the left arm bearing support structure to a second position;
• the left cam structure capable of engaging the registration member and causing the registration member to urge a sample support in a frame member against the front face and the left arm;
• the central cam structure capable of slideably engaging the right arm bearing support structure to urge the right arm bearing support structure to a second position;
• and
• wherein when the engagement member, the left arm bearing support structure and the right arm bearing support structure are in the respective second positions, the sample support transfer mechanism is capable of engaging a sample support in a frame member between the left arm and the right arm;
• a sample support unloading region between the central cam structure and the right cam structure comprising:
• a second disengagement member capable of urging the engagement member to a third position;
• and
• a sample support capture mechanism configured to retain a sample support in a frame member in the sample support unloading region;
• the central cam structure capable of slideably engaging the left arm bearing support structure to urge the left arm bearing support structure to a third position;
• the right cam structure capable of slideably engaging the right arm bearing support structure to urge the right arm bearing support structure to a third position;
• and
• wherein when the engagement member, the left arm bearing support structure and the right arm bearing support structure are in the respective third positions, the sample support transfer mechanism is capable of disengaging a sample support from between the left arm and the right arm.

A method for providing sample ions for mass analysis comprising:

• (a) supporting a plurality of samples on a surface of a sample support;
• (b) providing a vacuum lock chamber having a region for loading a sample support and a region for unloading a sample support;
• (c) providing a sample chamber having a sample transfer mechanism disposed therein,
• (d) extracting the sample support disposed in the region from loading with the sample transfer mechanism such that the sample support is registered within a frame in the sample support transfer mechanism to within about .±.0.002″ in a Z direction, to within about .±.0.005″ in a X direction, and to within about .±.0.005″ in a Y direction, wherein the X, Y and Z directions are mutually orthogonal and the direction Z is substantially perpendicular to the surface of the sample support;
• (e) translating the sample support to a first position within the sample chamber;
• (f) irradiating a first sample on the surface of the sample support with a pulse of energy while the sample support is being held by the sample transfer mechanism to form a first group of sample ions;
• (g) extracting at least a portion of the second group of sample ions in the Z direction;
• (h) translating the sample support to a second position within the sample chamber;
• (i) irradiating a second sample on the surface of the sample support with a pulse of energy while the sample support is being held by the sample transfer mechanism to form a second group of sample ions;
• (j) extracting at least a portion of the second group of sample ions in the Z direction;
• (k) placing the sample support in the region for unloading a sample support;
• and
• (l) repeating steps (d)-(k) for at least one more sample support.