Method of manufacturing a semiconductor device with a notched gate electrode
AssigneeFujitsu Limited
InventorTakashi Saiki
Life of this patent
Estimating the term…
Abstract
A silicon nitride film having a thickness of 3 nm or less is formed on the surfaces of a P-well and N-well, as well as on the upper and side surfaces of a gate electrode, in which the silicon nitride film can be formed, for example, by exposing the surface of the P-well and N-well, and the upper and side surfaces of the gate electrode to a nitrogen-gas-containing plasma using a magnetron RIE apparatus. Then, pocket layers, extension layers and source/drain layers are formed while leaving the silicon nitride film unremoved.
Claims2
A method of manufacturing a semiconductor device comprising the steps of:
- forming, on a semiconductor substrate having a first conductivity type, a gate insulating film which comprises a material having a dielectric constant higher than that of a silicon oxide film;
- forming, on said gate insulating film, a gate electrode having notches at the lower portions of both side surfaces;
- introducing nitrogen into the surfaces of said semiconductor substrate and said gate electrode;
- and
- forming a pair of impurity layers having the opposite conductivity type from said first conductivity type, which are formed in said semiconductor substrate to fall on both sides of the gate electrode.
A method of manufacturing a semiconductor device comprising the steps of:
- forming, on a semiconductor substrate having a first conductivity type, a gate insulating film which comprises a material having a dielectric constant higher than that of a silicon oxide film;
- forming, on said gate insulating film, a gate electrode having notches at the lower portions of both side surfaces;
- introducing nitrogen into the surfaces of said semiconductor substrate and said gate electrode;
- forming first side walls on the side surfaces of said gate electrode while placing a nitrogen-containing layer formed in said step for introducing nitrogen in between;
- forming a pair of first impurity layers having the opposite conductivity from said first conductivity type in said substrate to fall on both sides of said gate electrode;
- forming second side walls on the side surfaces of said gate electrode to cover said first said walls;
- and
- forming a pair of second impurity layers having the opposite conductivity from said first conductivity type in said substrate to fall on both sides of said gate electrode, and to partially overlap with said pair of first impurity layers.
Dependencies are inferred from the claim text.