Method for reducing leakage current in a vacuum field emission display
AssigneeMotorola, Inc.
InventorsKenneth A. Dean, Bernard F. Coll, Emmett M. Howard, Lyndee L. Tisinger
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Abstract
A fabrication process is provided for reducing leakage current in a field emission display having at least one electron emitter (24) electrically coupled to a ballast resistor (16) coupled to a cathode metal (14), wherein at least one defect (28) extends to a gate electrode (20) from a region (22) electrically coupled to the ballast resistor, the method comprising heating (32) to reduce the resistance of the ballast resistor; and applying (34) a voltage between the cathode metal and the gate electrode thereby creating a current through the at least one defect to create an electrical open therein.
Claims22
A method for reducing leakage current of a vacuum field emission device having at least one electron emitter electrically coupled to a ballast resistor coupled to a cathode metal, wherein at least one defect extends to a gate electrode from a region electrically coupled to the ballast resistor, the method comprising:
- heating to reduce the resistance of the ballast resistor;
- and
- applying a voltage between the cathode metal and the gate electrode, thereby creating a current through the at least one defect to create an electrical open therein.
A method for reducing leakage current of a field emission device having a plurality of carbon nanotubes grown above a ballast resistor coupled to a cathode metal for emitting electrons at an anode, wherein a carbon nanotube extends to a gate electrode, the method comprising:
- heating to reduce the resistance of the ballast resistor;
- and
- applying a voltage between the cathode metal and the gate electrode to create an electrical open within the carbon nanotube.
A method for reducing leakage current in a vacuum field emission device having a ballast resistor positioned between a cathode metal and a plurality of carbon nanotube emitters positioned on the anode, wherein at least one defect is undesirably coupled between the cathode metal and a gate electrode, the method comprising:
- heating the ballast resistor;
- and
- applying a voltage between the cathode metal, through the ballast resistor and the at least one carbon nanotube emitters, to the gate electrode.
Dependencies are inferred from the claim text.