Self-cleaning lower contact
AssigneeElectro Scientific Industries, Inc.
InventorDouglas J. Garcia
Life of this patent
Estimating the term…
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AssigneeElectro Scientific Industries, Inc.
InventorDouglas J. Garcia
Estimating the term…
An electrical component handler that tests electrical circuit components and includes a self-cleaning lower contact offers reduced yield loss and mean time between assists. A preferred embodiment of the electrical component handler includes multiple sets of upper and lower contacts, each set of which is spatially aligned to electrically contact a single device-under-test (DUT). Each DUT is seated in a test plate that transports the DUT to and from a test measurement position between the upper and lower contacts. The lower contact includes a contact tip that a biasing mechanism urges against the electrical component as it undergoes a test process and against a surface of the test plate as it transports the electrical component. The lower contact rubs against the test plate, thereby contributing to removal of contaminant material acquired by the contact tip during component handler operation.
A contact assembly configured for use in an electrical component handler and performance of electrical measurement of electrical components, the electrical components seated in a component holder that has a surface and advances relative to a contact tip of a contact element to successively place the electrical components in contact with the contact tip to perform the electrical measurement and to impart sliding contact of the surface of the component holder against the contact tip when none of the electrical components is in contact with the contact tip, comprising:
A double-sided contact element configured for placement in a contact assembly of an electrical component handler and performance of electrical measurement of electrical components, the electrical components seated in a component holder that has a surface and advances relative to a contact tip of a contact element to successively place the electrical components in contact with the contact tip to perform the electrical measurement and to impart sliding contact of the surface of the component holder against the contact tip when none of the electrical components is in contact with the contact tip, comprising:
Dependencies are inferred from the claim text.