System and method for non-destructively determining thickness and uniformity of anti-tamper coatings
AssigneeHoneywell International Inc.
InventorWilliam J. Dalzell
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AssigneeHoneywell International Inc.
InventorWilliam J. Dalzell
Estimating the term…
An improved system and method are disclosed for non-destructively determining the thickness and uniformity of an anti-tamper coating on a sensitive electronic part, such as, for example, an integrated circuit, multi-chip module, or other type of electronic device, component or equipment. The system includes an anti-tamper coating thickness measurement probe with a highly collimated beta radiation source and a Geiger-Muller tube sensitive to beta radiation arranged in close proximity to the beta radiation source. The probe is placed on or in close proximity to the anti-tamper coating on the part, so that the beta radiation electrons penetrate the coating material and are reflected back (back scattered) toward the beta radiation source and the Geiger-Muller tube. The Geiger-Muller tube collects the electrons from the back scattered radiation.
A system for non-destructively determining the thickness of an anti-tamper coating material on a part, comprising:
A system for non-destructively determining the thickness of an anti-tamper coating material on a part, comprising:
A method for non-destructively determining the thickness of a non-transparent anti-tamper coating material on a part, comprising the steps of:
A computer program product, comprising:
Dependencies are inferred from the claim text.