Method and apparatus for reversing performance degradation in semi-conductor detectors

A method of restoring a degraded performance of semiconductor elements comprising:

• identifying semiconductor elements which exhibit degraded energy resolution as compared to an initial level of energy resolution by applying a forward bias to the semiconductor elements to induce a degradation of energy resolution and heating to increase an ambient temperature to accelerate the degradation of the energy resolution in the semiconductor elements;
• and
• restoring degraded semiconductor elements to the initial level of energy resolution.

An apparatus for restoring performance of semiconductor elements including:

• an identifying processor to detect elements with degraded performance which results after application of forward bias, the identifying processor including a pixel analyzer which analyzes a response of each semiconductor element when the semiconductor elements are subjected to a radiation source, which pixel analyzer determines a spectral response of each semiconductor element;
• and
• a restoration processor which controls restoration of energy resolution of degraded elements to an initial level of energy resolution.

A system for identifying degraded energy resolution of semiconductor gamma radiation detection elements which are used in a gamma radiation detector assembly, the system comprising:

• a heater;
• and
• a bias means, the heater and bias means configured for use in identifying semiconductor elements which exhibit degraded gamma radiation energy resolution as compared to a selectable threshold level of gamma radiation energy resolution responsive to heating and bias applied by the heater and biasing combination.