Electronic method and system for detection of conducting or dielectric medium with dielectric constant higher than that of air

A method of detecting a presence of a conducting or dielectric environment with a dielectric constant higher than that of air comprising

• furnishing a measuring sensor (CP) including an electronic measurement key (K1) and a measurement capacitor (Cx);
• using the measuring sensor;
• sending reference control signals from a microprocessor control system (US) as necessary to charge a charging capacitor (Cp);
• counting a number of reference control signals (No), resulting from the relationship No=f(Qp, Qod, Ucc, Up, T),
• then discharging the previously-charged charging capacitor (Cp) to a threshold voltage (Up) preset by said microprocessor control system (US);
• sending measurement control signals (Nx) from said microprocessor control system (US) as necessary to charge a measurement capacitor (Cx);
• subsequently counting of a number of measurement control signals (Nx), resulting from the relationship Nx=f(Qp, Qx, Ucc, Up, T);
• then discharging the previously-charged charging capacitor (Cp) to said threshold voltage (Up) preset by the microprocessor control system (US), where;
• Qp—means the electric charge(s) collected in charging capacitor (Cp) during its charging
• Qod—means the electric charge(s) collected in a reference capacitor Cod during its charging with reference control signal (No)
• Qx—means the electric charge(s) collected in the reference capacitor (Cx), depending on the surrounding environment, during its charging with measurement control signal (Nx);
• Ucc—means, the supply voltage to the microprocessor control system (US) and the charging voltage of the charging capacitor (Cp), the measurement capacitor (Cx) and the reference capacitor (Cod);
• Up—means the voltage set by the microprocessor control system (US) to which the charging capacitor (Cp) should be discharged while counting the reference control signals (No) and the measurement control signals (Nx);
• T—means the ambient temperature at which the charging capacitor (Cp) and the measurement capacitor (Cx) and a remaining element of the microprocessor control system (US) are counting the discharge cycles of the charging capacitor (Cp);
• subsequently comparing a number of determined measurement control signals (Nx) with a number of reference control signals (No);
• obtaining a difference in those signals for indicating a presence of a conductive or dielectric environment in an immediate environment of the measurement capacitor (Cx);
• accumulating electric charges (Qp) in the charging capacitor (Cp);
• maintaining a measurement line (Pn) free from signals and thereby the electronic measurement key (K1) inactive;
• maintaining a reference line (Pod) free from signals and thereby an electronic reference key (K2) inactive;
• charging the reference line (Pod) with a cyclic rectangular signal;
• activating the electronic reference key (K2);
• causing a switching of the electronic reference key (K2);
• enabling accumulation of charges (Qod) in a reference capacitor (Cod).

A method of detecting a presence of a conducting or dielectric environment with a dielectric constant higher than that of air comprising

• furnishing a measuring sensor (CP) including an electronic measurement key (K1) and a measurement capacitor (Cx);
• using the measuring sensor;
• sending reference control signals from a microprocessor control system (US) as necessary to charge a charging capacitor (Cp);
• counting a number of reference control signals (No), resulting from the relationship No=f(Qp, Qod, Ucc, Up, T),
• then discharging the previously-charged charging capacitor (Cp) to a threshold voltage (Up) preset by said microprocessor control system (US);
• sending measurement control signals (Nx) from said microprocessor control system (US) as necessary to charge a measurement capacitor (Cx);
• subsequently counting of a number of measurement control signals (Nx), resulting from the relationship Nx=f(Qp, Ox, Ucc, Up, T);
• then discharging the previously-charged charging capacitor (Cp) to said threshold voltage (Up) preset by the microprocessor control system (US), where;
• Qp—means the electric charge(s) collected in charging capacitor (Cp) during its charging
• Qod—means the electric charge(s) collected in a reference capacitor Cod during its charging with reference control signal (No)
• Qx—means the electric charge(s) collected in the reference capacitor (Cx), depending on the surrounding environment, during its charging with measurement control signal (Nx);
• Ucc—means, the supply voltage to the microprocessor control system (US) and the charging voltage of the charging capacitor (Cp), the measurement capacitor (Cx) and the reference capacitor (Cod);
• Up—means the voltage set by the microprocessor control system (US) to which the charging capacitor (Cp) should be discharged while counting the reference control signals (No) and the measurement control signals (Nx);
• T—means the ambient temperature at which the charging capacitor (Cp) and the measurement capacitor (Cx) and a remaining element of the microprocessor control system (US) are counting the discharge cycles of the charging capacitor (Cp);
• subsequently comparing a number of determined measurement control signals (Nx) with a number of reference control signals (No);
• obtaining a difference in those signals for indicating a presence of a conductive or dielectric environment in an immediate environment of the measurement capacitor (Cx);
• switching an electronic reference key (K2) to a discharge condition of the charging capacitor (Cp);
• furnishing that the quantity of charges flowing off the charging capacitor (Cp) depends on the quantity of charges collected in a reference capacitor (Cod) during its charging;
• causing a step-wise drop in the voltage of the charging capacitor (Cp);
• monitoring the step-wise drop in the voltage by the microprocessor control system (US) relative to the threshold voltage (Up);
• sending so many reference control signals (No) by the microprocessor control system until the voltage on the charging capacitor (Cp) reaches a level of the threshold voltage (Up) present on the microprocessor control system (US);
• and
• counting the reference control signals (No).

A method of detecting a presence of a conducting or dielectric environment with a dielectric constant higher than that of air comprising

• furnishing a measuring sensor (CP) including an electronic measurement key (K1) and a measurement capacitor (Cx);
• using the measuring sensor;
• sending reference control signals from a microprocessor control system (US) as necessary to charge a charging capacitor (Cp);
• counting a number of reference control signals (No), resulting from the relationship No=f(Qp, Qod, Ucc, Up, T),
• then discharging the previously-charged charging capacitor (Cp) to a threshold voltage (Up) preset by said microprocessor control system (US);
• sending measurement control signals (Nx) from said microprocessor control system (US) as necessary to charge a measurement capacitor (Cx);
• subsequently counting of a number of measurement control signals (Nx), resulting from the relationship Nx=f(Qp, Qx, Ucc, Up, T);
• then discharging the previously-charged charging capacitor (Cp) to said threshold voltage (Up) preset by the microprocessor control system (US), where:
• Qp—means the electric charge(s) collected in charging capacitor (Cp) during its charging
• Qod—means the electric charge(s) collected in a reference capacitor Cod during its charging with reference control signal (No)
• Qx—means the electric charge(s) collected in the reference capacitor (Cx), depending on the surrounding environment, during its charging with measurement control signal (Nx);
• Ucc—means, the supply voltage to the microprocessor control system (US) and the charging voltage of the charging capacitor (Cp), the measurement capacitor (Cx) and the reference capacitor (Cod);
• Up—means the voltage set by the microprocessor control system (US) to which the charging capacitor (Cp) should be discharged while counting the reference control signals (No) and the measurement control signals (Nx);
• T—means the ambient temperature at which the charging capacitor (Cp) and the measurement capacitor (Cx) and a remaining element of the microprocessor control system (US) are counting the discharge cycles of the charging capacitor (Cp);
• subsequently comparing a number of determined measurement control signals (Nx) with a number of reference control signals (No);
• obtaining a difference in those signals for indicating a presence of a conductive or dielectric environment in an immediate environment of the measurement capacitor (Cx);
• switching the electronic measurement key (K1) to a discharge condition of the charging capacitor (Cp);
• furnishing that the quantity of charges flowing off the charging capacitor (Cp) depends on the quantity of measurement charges (Qx) collected in the measurement capacitor (Cx) during its charging;
• causing a step-wise drop in the voltage of the charging capacitor (Cp);
• monitoring the step-wise drop in the voltage by the microprocessor control system (US) relative to the threshold voltage (Up);
• sending so many measurement control signals (Nx) by the microprocessor control system (US) until the voltage on the measurement capacitor (Cx) reaches a level of the threshold voltage (Up) present on the microprocessor control system (US);
• and
• counting the measurement control signals (Nx).

A method of detecting a presence of a conducting or dielectric environment with a dielectric constant higher than that of air comprising

• furnishing a measuring sensor (CP) including an electronic measurement key (K1) and a measurement capacitor (Cx);
• using the measuring sensor;
• sending reference control signals from a microprocessor control system (US) as necessary to charge a charging capacitor (Cp);
• counting a number of reference control signals (No), resulting from the relationship No=f(Qp, Qod, Ucc, Up, T),
• then discharging the previously-charged charging capacitor (Cp) to a threshold voltage (Up) preset by said microprocessor control system (US);
• sending measurement control signals (Nx) from said microprocessor control system (US) as necessary to charge a measurement capacitor (Cx);
• subsequently counting of a number of measurement control signals (Nx), resulting from the relationship Nx=f(Qp, Qx, Ucc, Up, T);
• then discharging the previously-charged charging capacitor (Cp) to said threshold voltage (Up) preset by the microprocessor control system (US), where:
• Qp—means the electric charge(s) collected in charging capacitor (Cp) during its charging
• Qod—means the electric charge(s) collected in a reference capacitor Cod during its charging with reference control signal (No)
• Qx—means the electric charge(s) collected in the reference capacitor (Cx), depending on the surrounding environment, during its charging with measurement control signal (Nx);
• Ucc—means, the supply voltage to the microprocessor control system (US) and the charging voltage of the charging capacitor (Cp), the measurement capacitor (Cx) and the reference capacitor (Cod);
• Up—means the voltage set by the microprocessor control system (US) to which the charging capacitor (Cp) should be discharged while counting the reference control signals (No) and the measurement control signals (Nx);
• T—means the ambient temperature at which the charging capacitor (Cp) and the measurement capacitor (Cx) and a remaining element of the microprocessor control system (US) are counting the discharge cycles of the charging capacitor (Cp);
• subsequently comparing a number of determined measurement control signals (Nx) with a number of reference control signals (No);
• obtaining a difference in those signals for indicating a presence of a conductive or dielectric environment in an immediate environment of the measurement capacitor (Cx);
• comparing a recorded quantity of reference control signals (No) with a recorded quantity of measurement control signals (Nx);
• obtaining a comparison result;
• employing the comparison result as a basis for the microprocessor control system (US);
• signalling with the microprocessor control system (US) a presence of a conducting or dielectric environment around the measurement capacitor (Cx).

A method of detecting a presence of a conducting or dielectric environment with a dielectric constant higher than that of air comprising

• furnishing a measuring sensor (CP) including an electronic measurement key (K1) and a measurement capacitor (Cx);
• using the measuring sensor;
• sending reference control signals from a microprocessor control system (US) as necessary to charge a charging capacitor (Cp);
• counting a number of reference control signals (No), resulting from the relationship No=f(Qp, Qod, Ucc, Up, T),
• then discharging the previously-charged charging capacitor (Cp) to a threshold voltage (Up) preset by said microprocessor control system (US);
• sending measurement control signals (Nx) from said microprocessor control system (US) as necessary to charge a measurement capacitor (Cx);
• subsequently counting of a number of measurement control signals (Nx), resulting from the relationship Nx=f(Qp, Qx, Ucc, Up, T);
• then discharging the previously-charged charging capacitor (Cp) to said threshold voltage (Up) preset by the microprocessor control system (US), where:
• Qp—means the electric charge(s) collected in charging capacitor (Cp) during its charging
• Qod—means the electric charge(s) collected in a reference capacitor Cod during its charging with reference control signal (No)
• Qx—means the electric charge(s) collected in the reference capacitor (Cx), depending on the surrounding environment, during its charging with measurement control signal (Nx);
• Ucc—means, the supply voltage to the microprocessor control system (US) and the charging voltage of the charging capacitor (Cp), the measurement capacitor (Cx) and the reference capacitor (Cod);
• Up—means the voltage set by the microprocessor control system (US) to which the charging capacitor (Cp) should be discharged while counting the reference control signals (No) and the measurement control signals (Nx);
• T—means the ambient temperature at which the charging capacitor (Cp) and the measurement capacitor (Cx) and a remaining element of the microprocessor control system (US) are counting the discharge cycles of the charging capacitor (Cp);
• subsequently comparing a number of determined measurement control signals (Nx) with a number of reference control signals (No);
• obtaining a difference in those signals for indicating a presence of a conductive or dielectric environment in an immediate environment of the measurement capacitor (Cx);
• counting a quantity of reference control signals (No) necessary for discharging the charging capacitor (Cp);
• charging the measurement capacitor (Cx) when air is the environment surrounding the measurement capacitor (Cx);
• counting a number of reference control signals (No);
• saving the number of reference control signals (No);
• checking a presence of a dielectric environment;
• counting measurement control signals (Nx);
• comparing a quantity of measurement control signals (Nx) with a quantity of reference control signals (No);
• signaling by the microprocessor control system (US) the presence of a conducting or dielectric environment in a vicinity of the measurement capacitor (Cx) based on a result of the comparing step.

An electronic system for a detection of a presence of a conducting, or dielectric environment with a dielectric constant higher than that of air comprising

• a microprocessor control system (US) having a voltage input Ucc;
• a charging capacitor (Cp) electrically connected to the microprocessor control system (US);
• an electronic measurement key (K1);
• and
• a measurement capacitor (Cx) depending on a surrounding, conductive or dielectric, environment, and having a first polarity connected to said electronic measurement key (K1), wherein the electronic measurement key (K1) and the measurement capacitor (Cx) form a measuring sensor (CP);
• a measurement line (Pn) connecting the microprocessor control system (US) to the electronic measurement key (K1) and constituting a charging-current output of the measurement capacitor (Cx) as well as the discharge-current input of the charging capacitor (CP);
• a first charging line (I/S) connecting the microprocessor control system to a first polarity of the charging capacitor (Cp) and to the electronic measurement key (K1), and constituting the charging-current output of the charging capacitor (Cp) as well as an input for voltage testing during discharging of the charging capacitor (Cp);
• a second charging line (CEN) connecting the microprocessor control system (US) to a second polarity of the charging capacitor (Cp), and constituting both the charging-current input for capacitor (Cp) and discharge-current output of said capacitor, wherein the second charging line (CEN) is also indirectly connected through the charging capacitor (Cp) with the electronic measurement key (K1),
• a common ground line connecting the microprocessor control system (US) to a second polarity of the measurement capacitor (Cx) and wherein the microprocessor control system (US) is connected through the measurement capacitor (Cx) with the electronic measurement key (K1).