Measurement method and device for the measurement of a path covered
AssigneeCameron International Corporation
InventorsPeter Kunow, Klaus Biester
Life of this patent
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AssigneeCameron International Corporation
InventorsPeter Kunow, Klaus Biester
Estimating the term…
With a measurement method and a measurement device for the measurement of a path covered by a first object (1) in relation to a second object (2), a measurement body (3) is deformed by a relative movement of the objects and at least a first deformation sensor (4) assigned to the measurement body (3) converts the measurement body (3) deformation into a measurement signal. The measurement signal is converted by an evaluation device (20) into information on the path covered. In order to increase the precision and measurement speed in a way that is simple structurally and saves space, the measurement signal is emitted when an area of the measurement body (3) is stretched along the longitudinal axis (6) of the measurement body (3) and a further area is compressed along the longitudinal axis (6) of the measurement body (3).
A method for measuring a path traveled by a first object relative to a second object, comprising:
Measurement method for the measurement of a path covered by a first object in relation to a second object, whereby a measurement body is deformed by the relative movement of the objects and at least one first deformation sensor assigned to the measurement body converts the measurement body deformation into a first measurement signal and then an evaluation device converts the first measurement signal at least into information on the path covered, comprising:
An apparatus for measuring a path traveled by a first object relative to a second object, the apparatus comprising:
Measurement device for the measurement of a path covered by a first object in relation to a second object with at least one measurement body which can be deformed by the relative movement, to which at least a first deformation sensor is allocated to produce a measurement signal corresponding to the deformation, comprising:
Measurement device for the measurement of a path covered by a first object in relation to a second object with at least one measurement body which can be deformed by the relative movement, to which at least a first deformation sensor is allocated to produce a measurement signal corresponding to the deformation, comprising:
Measurement device for the measurement of a path covered by a first object in relation to a second object with at least one measurement body which can be deformed by the relative movement, to which at least a first deformation sensor is allocated to produce a measurement signal corresponding to the deformation, comprising:
Dependencies are inferred from the claim text.