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US 7,401,498 B2Granted
Multiple trace portal detection systems
AssigneeSyagen Technology
InventorsJack A. Syage, Karl A. Hanold
Life of this patent
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Abstract
A detector system that can analyze multiple samples with a single detector. The detector may contain a portal with a first opening and a second opening. A first sample is obtained from the first opening and a second sample is obtained from the second opening. The openings are coupled to a single detector that can analyze both samples.
Claims13
A detector system, comprising:
- a portal that has a first opening and a second opening;
- a first concentrator that is coupled to said first opening;
- a second concentrator that is coupled to said second opening;
- a single detector coupled to said first and second concentrators;
- and,
- a pump coupled to said first and second openings so that said first concentrator collects vapor and particles through said first opening and said second concentrator collects vapor and particles through said second opening, simultaneously with said first concentrator collecting vapor and particles.
3 more elements
A method for analyzing samples, comprising:
- obtaining a first sample from the first opening of a portal;
- and,
- obtaining a second sample from a second opening of the portal, simultaneously with obtaining the first sample from a first opening;
- and, analyzing the first sample with a single detector.
1 more element
Dependencies are inferred from the claim text.