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US 7,398,169 B2Granted
Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
AssigneeAdvantest Corporation
InventorsTakahiro Yamaguchi, Satoshi Iwamoto, Masakatsu Suda, Masahiro Ishida
Life of this patent
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Abstract
There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.
Claims26
A measuring apparatus for measuring a signal-under-test, comprising:
- a comparator for sequentially comparing voltage values of said signal-under-test with a reference voltage value fed thereto at a timing of strobe signals sequentially fed thereto;
- a strobe timing generator for sequentially generating the strobe signals at substantially equal time intervals;
- a capture memory for storing a comparison result of said comparator;
- and
- a digital signal processing section for calculating jitter of said signal-under-test based on the comparison result stored in said capture memory,
- wherein said comparator outputs comparison results that differ from each other depending on whether or not the voltage value of said signal-under-test is greater than said reference voltage value.
3 more elements
A testing apparatus for testing a device-under-test, comprising:
- a measuring apparatus for measuring jitter of a signal-under-test output from said device-under-test;
- and
- a jitter judging section for judging whether or not said device-under-test is defect-free based on the jitter measured by said measuring apparatus;
- wherein said measuring apparatus comprises:
- a comparator for sequentially comparing voltage values of said signal-under-test with a reference voltage value given thereto at timing of strobe signals sequentially fed thereto;
- a strobe timing generator for sequentially generating the strobe signals placed at substantially equal time intervals;
- a capture memory for storing comparison results of said comparator;
- and
- a digital signal processing section for calculating the jitter of said signal-under-test based on said comparison results stored in said capture memory;
- wherein said comparator outputs comparison results that differ from each other depending on whether or not the voltage value of said signal-under-test is greater than said reference voltage value.
7 more elements
A measuring method for measuring a signal-under-test having a predetermined period, comprising:
- sequentially comparing voltage values of said signal-under-test with a given reference voltage value at timing of strobe signals sequentially given;
- sequentially generating the strobe signals placed at substantially equal time intervals;
- storing comparison results of a comparator;
- and
- calculating the jitter of said signal-under-test based on said comparison results stored during said storing;
- wherein said comparator outputs comparison results that differ from each other depending on whether or not the voltage value of said signal-under-test is greater than said reference voltage value.
3 more elements
A testing method for testing a device-under-test, comprising:
- measuring jitter of a signal-under-test output from said device under-test;
- and
- judging whether or not said device-under-test is defect-free based on the jitter measured in said measuring step;
- wherein said measuring step includes:
- sequentially comparing voltage values of said signal-under-test with a given reference voltage value at timing of strobe signals sequentially given;
- sequentially generating the strobe signals placed at substantially equal time intervals;
- storing comparison results of a comparator;
- and
- calculating the jitter of said signal-under-test based on said comparison results stored during said storing;
- wherein said comparator outputs comparison results that differ from each other depending on whether or not the voltage value of said signal-under-test is greater than said reference voltage value.
7 more elements
A measuring apparatus for measuring a signal-under-test having a predetermined period, comprising:
- a comparator for sequentially comparing a voltage value of said signal-under-test, a first reference voltage value and a second reference voltage value given thereto at timing of strobe signals sequentially given thereto to output comparison results of three values;
- a capture memory for storing the comparison result of said comparator;
- and
- a digital signal processing section for calculating jitter of said signal-under-test based on the comparison result stored in said capture memory;
- wherein said comparator is constructed and arranged to receive the first reference voltage and the second reference voltage whose voltage value is lower than said first reference voltage and to output comparison results that differ from each other depending on whether or not the voltage value of said signal-under-test is greater than said first reference voltage, whether or not the voltage value of said signal-under-test is smaller than said first reference voltage and greater than said second reference voltage or whether the voltage value of said signal-under-test is smaller than said second reference voltage.
2 more elements
An electronic device for outputting a signal-under-test, comprising:
- an operation circuit for generating said signal-under-test;
- and
- a measuring apparatus for measuring said signal-under-test;
- wherein said measuring apparatus comprises:
- a comparator for sequentially comparing a voltage value of said signal-under-test with a reference voltage value given thereto at timing of strobe signals sequentially given thereto;
- and
- a capture memory for storing a comparison result of said comparator;
- wherein said comparator outputs comparison results that differ from each other depending on whether or not the voltage value of said signal-under-test is greater than said reference voltage value.
5 more elements
Dependencies are inferred from the claim text.