Method and system for analyzing throughput
AssigneeGM Global Technology Operations LLC
InventorEric A. Steinhilper
Life of this patent
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Abstract
Described is a method and system for analyzing throughput of a production line. The method includes selecting among the stations, a set of susceptible stations that are affected by at least one selected event, ranking the susceptible stations with respect to a selected event and the predetermined criteria to determine an ordered list of more susceptible stations, altering the selected events to generate a new set of events, reranking the susceptible stations with respect to the selected events comprising the new event to determine a new ordered list of more susceptible stations and determining the most susceptible station based on a comparison criterion of the original ordered list of more susceptible stations and the new ordered list of more susceptible stations.
Claims20
A throughput analysis method for a manufacturing line including a plurality of machines, each configured to generate event codes which are input to the throughput analysis, the throughput analysis method comprising:
- calculating a first throughput value for the plurality of machines based on the input;
- ranking the plurality of machines and their associated event codes according to their effect on throughput;
- altering a value of a first event code associated with a first machine to generate an altered first event code for a new event code input;
- recalculating a second throughput value based on the new event code input;
- and
- comparing the first throughput value with the second throughput value to generate a weight of the first event code on the first throughput value.
A method for evaluating stations of a system for improvability according to predetermined criteria, the method comprising;
- selecting among the stations, a set of susceptible stations that are affected by at least one selected event;
- ranking the susceptible stations with respect to a selected event and the predetermined criteria to determine an ordered list of more susceptible stations;
- altering the selected events to generate a new set of events;
- reranking the susceptible stations with respect to the selected events comprising the new event to determine a new ordered list of more susceptible stations;
- and
- determining the most susceptible station based on a comparison criterion of the original ordered list of more susceptible stations and the new ordered list of more susceptible stations.
A manufacturing line system comprising a plurality of machines configured to generate event codes as input, the input delivered to a computational subsystem, the system comprising:
- a calculating module for calculating a first throughput value for the plurality of machines based on the event code input;
- a ranking module for ranking the plurality of machines and their associated the event codes according to their effect on throughput;
- an altering module for altering a value of a first event code to generate an altered first event code to generate new event code input;
- a recalculating module for recalculating the second throughput value based on the new event code input;
- and
- a comparing module for comparing the first throughput value with the second throughput value to generate an influence value for the altered event code inputs on the first throughput value.
Dependencies are inferred from the claim text.