Testing device for testing electronic device and testing method thereof

A testing device for testing an electronic device, comprising:

• a sinusoidal jitter application unit operable to apply sinusoidal jitter to a given input signal and supply said input signal with said sinusoidal jitter to said electronic device;
• a jitter amount controller operable to control magnitude of said sinusoidal jitter applied by said sinusoidal jitter application unit;
• and
• a determination unit operable to determine whether or not said electronic device is defective based on an output signal output from said electronic device in accordance with said input signal, wherein
• said jitter amount controller determines said magnitude of said sinusoidal jitter based on a threshold value of a peak-to-peak value of alignment jitter between said input signal and a recovered clock signal recovered by said electronic device from said input signal, and a jitter transfer junction in said electronic device that is nondefective.

A testing method for testing an electronic device, comprising:

• applying deterministic jitter to a given input signal without causing an amplitude modulation component and supplying said input signal with said deterministic jitter to said electronic device;
• controlling magnitude of said deterministic jitter applied in the application of said deterministic jitter;
• and
• determining whether or not said electronic device is defective based on an output signal output from said electronic device in accordance with said input signal;
• wherein the magnitude of the deterministic jitter is determined based on a threshold value of a peak-to-peak value of alignment jitter between said input signal and a recovered clock signal recovered by said electronic device from said input signal.

A testing method for testing an electronic device, comprising:

• applying sinusoidal jitter to a given input signal and supplying said input signal with said sinusoidal jitter to said electronic device;
• controlling magnitude of said sinusoidal jitter applied in said application of said sinusoidal jitter;
• and
• determining whether or not said electronic device is defective based on an output signal output from said electronic device in accordance with said input signal, wherein
• said controlling of said magnitude of said sinusoidal jitter determines said magnitude of said sinusoidal jitter based on a threshold value of a peak-to-peak value of alignment jitter between said input signal and a recovered clock signal recovered by said electronic device from said input signal, and a jitter transfer function of said electronic device that is nondefective.