Pass-line insensitive sensor
AssigneeHoneywell International Inc.
InventorReijo Kuusela
Life of this patent
Estimating the term…
Abstract
Devices, systems and methods for detecting surface characteristics of a sample surface are disclosed. The exemplary system may have a conveying device for moving a sample surface and a light source for reflecting a beam of light off the sample surface. A light detector may receive the beam of light reflected from the sample surface. The area of the beam of light may be unequal to an area of a light detection surface of the light detector. A reference analyzer may determine the optical surface based on a comparison of the reflected light received with known reflected light values for known sample surfaces.
Claims20
A device comprising:
- a light source for reflecting a beam of light off a sample surface;
- a light detector for receiving the beam of light reflected from the sample surface, wherein an area of the beam of light is unequal to an area of a light detection surface of the light detector when the sample surface is at an optimal measurement position, when the sample surface is closer to the light detector than the optimal measurement position, and when the sample surface is farther from the light detector than the optimal measurement position;
- and
- a reference analyzer for determining one or more surface characteristics of the sample surface based on a comparison of (i) the reflected light received by the light detector and (ii) known reflected light values for known sample surfaces.
A method comprising the acts of:
- emitting a beam of light;
- reflecting the beam of light off a sample surface;
- detecting the beam of light reflected from the sample surfaces, wherein an area of the beam of light is unequal to an area of a light detection surface of a light detector when the sample surface is at an optimal measurement position, when the sample surface is closer to the light detector than the optimal measurement position, and when the sample surface is farther from the light detector than the optimal measurement position;
- and
- determining one or more surface characteristics of the sample surface based on a comparison of (i) the reflected beam of light and (ii) known reflected light values for known sample surfaces.
A device comprising:
- means for reflecting a beam of light off a sample surface of a moving web of material;
- means for receiving the beam of light reflected from the sample surface, wherein the diameter of the beam of light is unequal to a diameter of a light detection surface of the receiving means when the sample surface is at an optimal measurement position, when the sample surface is closer to the receiving means than the optimal measurement position, and when the sample surface is farther from the receiving means than the optimal measurement position;
- and
- means for determining one or more surface characteristics of the sample surface based on a comparison of (i) the reflected light received by the receiving means and (ii) known reflected light values for known sample surfaces.
Dependencies are inferred from the claim text.