Distortion measuring device, method, program, and recording medium
AssigneeAdvantest Corporation
InventorJunichi Ukita
Life of this patent
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Abstract
There is provided a distortion measuring device including a Brillouin scattered light spectrum recording unit which records a spectrum of Brillouin scattered light generated in an optical fiber as a result of supplying incident light, a peak frequency approximating unit which acquires an approximated peak frequency at which the recorded spectrum takes a maximal value, a peak frequency deriving unit which derives a peak frequency at which the spectrum takes the maximal value within a range of a frequency determined based on a magnitude of the spectrum at the approximated peak frequency, amid a distortion deriving unit which derives distortion of the optical fiber based on the derived peak frequency.
Claims14
A distortion measuring device comprising:
- a peak frequency approximator that acquires an approximated peak frequency, of two types of approximated peak frequencies, at which a spectrum of Brillouin scattered light generated by supplying a device under test with incident light has a maximum value;
- a peak frequency deriver that derives a peak frequency at which the spectrum has a maximum value within a range of a frequency, the range of the frequency comprising a predetermined range from the approximated peak frequency at which the spectrum has a larger value;
- and
- a distortion deriver that derives distortion of the device under test based on the derived peak frequency.
A distortion measuring method comprising:
- acquiring an approximated peak frequency, of two types of approximated peak frequencies, at which a spectrum of Brillouin scattered light generated by supplying a device under test with incident light has a maximum value;
- deriving a peak frequency at which the spectrum has a maximum value within a range of a frequency, the range of the frequency comprising a predetermined range from the approximated peak frequency at which the spectrum has a larger value;
- and
- deriving distortion of the device under test based on the derived peak frequency.
A computer-readable medium having a program of instructions for execution by the computer to perform processing for measuring a distortion, the processing comprising:
- acquiring an approximated peak frequency, of two types of approximated peak frequencies, at which a spectrum of Brillouin scattered light generated by supplying a device under test with incident light has a maximum value;
- deriving a peak frequency at which the spectrum has a maximum value within a range of a frequency, the range of the frequency comprising a predetermined range from the approximated peak frequency at which the spectrum has a larger value;
- and
- deriving distortion of the device under test based on the derived peak frequency.
A distortion measuring device comprising:
- a peak frequency approximator that acquires an approximated peak frequency, of two types of approximated peak frequencies, at which a spectrum of Brillouin scattered light generated by supplying a device under test with incident light has a maximum value;
- a peak frequency deriver that derives a peak frequency at which the spectrum has a maximum value within a range of a frequency, and when the spectrum at a first approximated peak frequency is larger than at a second approximated peak frequency by a value equal to or greater than a predetermined value, the range of the frequency comprises a predetermined range from the first approximated peak frequency;
- and
- a distortion deriver that derives distortion of the device under test based on the derived peak frequency.
A distortion measuring method comprising:
- acquiring an approximated peak frequency, of two types of approximated peak frequencies, at which a spectrum of Brillouin scattered light generated by supplying a device under test with incident light has a maximum value;
- deriving a peak frequency at which the spectrum has a maximum value within a range of a frequency, and when the spectrum at a first approximated peak frequency is larger than at a second approximated peak frequency by a value equal to or greater than a predetermined value, the range of the frequency comprises a predetermined range from the first approximated peak frequency;
- and
- deriving distortion of the device under test based on the derived peak frequency.
Dependencies are inferred from the claim text.