US 7,397,263 B2 · Sensor differentiated fault isolation

Abstract

Disclosed is an apparatus and method for diagnostically testing circuitry within a device. The apparatus and method incorporate the use of energy (e.g., light, heat, magnetic, electric, etc.) applied directly to any location on the device that can affect the electrical activity within the circuitry being tested in order to produce an indicator of a response. A local sensor (e.g., photonic, magnetic, etc.) is positioned at another location on the device where the sensor can detect the indicator of the response within the circuitry. A correlator is configured with response location correlation software and/or circuit tracing software so that when the indicator is detected, the correlator can determine the exact location of a response causing a device failure and/or trace the connectivity of the circuitry, based upon the location of the energy source and the location of the sensor.

Claims20

Dependent claims

A method for diagnostically testing circuitry of a device, said method comprising:

conditioning said device to activate a response within said circuitry;
applying a stimulating energy source directly to any first location on a surface of said device such that electrical activity in said circuitry is affected producing an indicator of said response;
locally detecting, by a sensor, said indicator of said response within said circuitry, wherein said sensor is located on said surface of said device at a specific second location different from said first location;
correlating said first location on said surface of said device with said specific second location on said surface of said device in order to determine at least one of a location within said circuitry responsible for said response and a connectivity of said circuitry, based on preset criteria and said indicator,
wherein said first location is independent of a location of any other structure connected to said device.

2 more elements

A method for diagnostically testing circuitry of a device, said method comprising:

conditioning said device to activate a response within said circuitry;
applying a stimulating energy source directly to any first location on a surface of said device such that electrical activity in said circuitry is affected producing an indicator of said response;
locally detecting, by a sensor, said indicator of said response within said circuitry, wherein said sensor is located on said surface of said device at a specific second location different from said first location and wherein said sensor is not electrically connected to said device;
and
correlating said first location on said surface of said device with said specific second location on said surface of said device at a time said indicator was sensed to determine a location within said circuitry responsible for said response,
wherein said first location is independent of a location of any other structure connected to said device.

3 more elements

A method for diagnostically testing circuitry of a device, said method comprising:

inputting test pattern signals into input pins of said device;
monitoring output pins of said device for a fail indication;
determining, based on said fail indication, which circuitry within said device requires diagnostic testing;
applying a stimulating energy source directly to any first location on a surface of said device, without contacting said device, such that electrical activity in said circuitry is affected producing an indicator of said response;
locally detecting, by a sensor, said indicator of said response within said circuitry, wherein said sensor is located on said surface of said device at a specific second location different from said first location and wherein said sensor is not electrically connected to any of said output pins;
and
correlating said first location on said surface of said device with said specific second location on said surface of said device at a time said indicator was sensed to determine a location within said circuitry responsible for said response,
wherein said first location is independent of a location of any other structure connected to said device.

5 more elements

Dependencies are inferred from the claim text.

Sensor differentiated fault isolation

Life of this patent

Sensor differentiated fault isolation

Life of this patent

Abstract

Claims20