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AssigneeAgilent Technologies, Inc.
InventorsReid A. Brennen, Tom A van de Goor, Gangqiang Li, Kevin P. Killeen
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The invention described herein provides a mass spectrometry system, having an ion source including an ionization device for producing ions, a collection conduit adjacent to the ionization device for collecting ions produced by the ionization device, a first gas source for supplying gas to desolvate ions produced by the ionization device, a second gas source for supplying gas at a defined flow to the ionization region, and a detector downstream from the ion source for detecting ions produced by the ion source. The invention also provides an ion source including an ionization device for producing ions, a collection conduit adjacent to the ionization device for collecting ions produced by the ionization device, a first gas source for supplying gas to desolvate ions produced by the ionization device, and a second gas source for supplying gas at a defined flow to the ionization region. A method for producing analyte ions is also disclosed. The method includes producing analyte ions from an ionization device, directing a first heated gas toward the analyte ions to desolvate the analyte ions, and directing a second gas toward the analyte ions at a defined and continual flow rate.
An ion source comprising:
A mass spectrometly system, comprising:
A method of improving a mass spectrometer's sensitivity comprising:
Dependencies are inferred from the claim text.