Methods for forming an enriched metal oxide surface
AssigneeMicron Technology, Inc.
InventorsStephen W. Russell, Max Hineman
Life of this patent
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Abstract
Methods of forming a metal oxide surface that is enriched with metal oxide in its higher oxidation state are provided. A metal oxide surface that is enriched with metal oxide in its higher oxidation state is also provided.
Claims35
A method of forming a metal oxide surface that is enriched with metal oxide in its higher oxidation state comprising:
- providing a metal layer;
- oxidizing said metal layer to form a metal oxide surface, wherein the metal oxide surface comprises metal oxide in a first oxidation state;
- reducing the metal oxide surface, wherein the reduced metal oxide surface comprises metal oxide in a first oxidation state and metal atom;
- and
- oxidizing the reduced metal oxide surface to form a metal oxide surface that is enriched with metal oxide in its higher oxidation state, wherein the enriched metal oxide surface comprises metal oxide in a first oxidation state and metal oxide in a second oxidation state, and wherein the metal comprises at least two oxidation states.
A method of forming a metal oxide surface that is enriched with metal oxide in its higher oxidation state comprising:
- providing a metal layer;
- oxidizing said metal layer to form a metal oxide surface, wherein the metal oxide surface comprises metal oxide in a first oxidation state, and wherein oxidizing the metal layer comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the metal layer;
- reducing the metal oxide surface, wherein the reduced metal oxide comprises metal oxide in a first oxidation state and metal atom, and wherein reducing the metal oxide surface comprises:
- flowing a reducing gas mixture comprising at least one hydrogen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the reducing gas mixture to form a reducing plasma;
- and utilizing the reducing plasma to reduce the metal oxide surface;
- and
- oxidizing the reduced metal oxide surface to form a metal oxide surface that is enriched with metal oxide in its higher oxidation state, wherein the enriched metal oxide surface comprises metal oxide in a first oxidation state and metal oxide in a second oxidation state, and wherein oxidizing the metal oxide surface comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the reduced metal oxide surface, and wherein the metal comprises at least two oxidation states.
A method of forming a metal oxide surface that is enriched with metal oxide in its higher oxidation state comprising:
- providing a metal layer;
- oxidizing said metal layer to form a metal oxide surface comprising metal oxide in a first oxidation state, wherein oxidizing the metal layer comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the metal layer;
- reducing the metal oxide surface, wherein the reduced metal oxide surface comprises metal oxide in a first oxidation state and metal atom, and wherein reducing the metal oxide surface comprises:
- flowing a reducing gas mixture comprising at least one hydrogen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the reducing gas mixture to form a reducing plasma;
- and utilizing the reducing plasma to reduce the metal oxide surface;
- and
- oxidizing the reduced metal oxide surface to form a metal oxide surface that is enriched with metal oxide in its higher oxidation state, wherein the enriched metal oxide surface comprises metal oxide in a first oxidation state and metal oxide in a second oxidation state, wherein oxidizing the second metal oxide surface comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the reduced metal oxide surface;
- wherein the metal comprises at least two oxidation states.
A method of limiting oxygen diffusion and penetration into a metal layer comprising:
- providing a metal layer;
- exposing said metal layer to oxygen to create a metal oxide surface comprising metal oxide in a first oxidation state;
- reducing the metal oxide surface, wherein the reduced metal oxide surface comprises metal oxide in a first oxidation state and metal atom;
- and
- oxidizing the reduced metal oxide surface to form a metal oxide surface that is enriched with metal oxide in its higher oxidation state, wherein the enriched metal oxide surface comprises metal oxide in a first oxidation state and metal oxide in a second oxidation state, and wherein the metal comprises at least two oxidation states.
A method of limiting metal loss in a metal layer comprising:
- providing a metal layer;
- exposing the metal layer to oxygen to create a metal oxide surface comprising metal oxide in a first oxidation state;
- reducing the metal oxide surface, wherein the reduced metal oxide surface comprises metal oxide in a first oxidation state and metal atom, and wherein reducing the first metal oxide surface comprises:
- flowing a reducing gas mixture comprising at least one hydrogen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the reducing gas mixture to form a reducing plasma;
- and utilizing the reducing plasma to reduce the metal oxide surface;
- and
- oxidizing the reduced metal oxide surface to form a metal oxide surface that is enriched with metal oxide in its higher oxidation state, wherein the enriched metal oxide surface comprises metal oxide in a first oxidation state and metal oxide in a second oxidation state, wherein oxidizing the metal oxide surface comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the reduced metal oxide surface, and wherein the metal comprises at least two oxidation states.
A method of forming a copper oxide surface that is enriched with copper oxide in its higher oxidation state comprising:
- providing a copper layer;
- oxidizing said copper layer to form a copper oxide surface comprising copper oxide in a first oxidation state;
- reducing the copper oxide surface, wherein the reduced copper oxide surface comprises copper oxide in a first oxidation state and copper atom;
- and
- oxidizing the reduced copper oxide surface to form a copper oxide surface that is enriched with copper oxide in its higher oxidation state, wherein the enriched copper oxide surface comprises copper oxide in a first oxidation state and copper oxide in a second oxidation state.
A method of forming a copper oxide surface that is enriched with copper oxide in its higher oxidation state comprising:
- providing a copper layer;
- oxidizing the copper layer to form a copper oxide surface comprising copper oxide in a first oxidation state, wherein oxidizing the copper layer comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the copper layer;
- reducing the copper oxide surface, wherein the reduced copper oxide surface comprises copper oxide in a first oxidation state and copper ion, and wherein reducing the copper oxide surface comprises:
- flowing a reducing gas mixture comprising at least one hydrogen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the reducing gas mixture to form a reducing plasma;
- and utilizing the reducing plasma to reduce the copper oxide surface;
- and
- oxidizing the reduced copper oxide surface to form a copper oxide surface that is enriched with copper oxide in its higher oxidation state, wherein the enriched copper oxide surface comprises copper oxide in a first oxidation state and copper oxide in a second oxidation state, and wherein oxidizing the second copper oxide surface comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the reduced copper oxide surface.
A method of forming a copper oxide surface that is enriched with copper oxide in its higher oxidation state comprising:
- providing a copper layer;
- oxidizing the copper layer to form a copper oxide surface comprising copper oxide in a first oxidation state, wherein oxidizing the copper layer comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and utilizing the oxidizing plasma to oxidize the copper layer;
- reducing the copper oxide surface, wherein the reduced copper oxide surface comprises copper oxide in a first oxidation state and copper ion, wherein reducing the copper oxide surface comprises:
- flowing a reducing gas mixture comprising at least one hydrogen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the reducing gas mixture to form a reducing plasma;
- and utilizing the reducing plasma to reduce the copper oxide surface;
- and
- oxidizing the reduced copper oxide surface to form a copper oxide surface that is enriched with copper oxide in its higher oxidation state, wherein the enriched copper oxide surface comprises copper oxide in a first oxidation state and copper oxide in a second oxidation state, wherein oxidizing the second copper oxide surface comprises:
- flowing an oxidizing gas mixture comprising at least one oxygen containing gas and at least one inert gas into the plasma processing chamber;
- striking a plasma in the plasma processing chamber from the oxidizing gas mixture to form an oxidizing plasma;
- and
- utilizing the oxidizing plasma to oxidize the reduced copper oxide surface.
A method of forming a metal oxide surface that is enriched with metal oxide in a higher oxidation state comprising:
- providing a metal layer with metal oxide surface, wherein the metal oxide surface comprises metal oxide in a first oxidation state;
- reducing the metal oxide surface layer, wherein the reduced metal oxide surface layer comprises metal oxide in a first oxidation state and metal atom;
- and
- oxidizing the reduced metal oxide surface to form a metal oxide surface that is enriched with metal oxide in its higher oxidation state, wherein the enriched metal oxide surface comprises metal oxide in a first oxidation state and metal oxide in a second oxidation state;
- wherein the metal comprises at least two oxidation states.
A method of forming a copper oxide surface that is enriched with copper oxide in a higher oxidation state comprising:
- providing a copper layer with copper oxide surface, wherein the copper oxide surface comprises copper oxide in a first oxidation state;
- and
- reducing the copper oxide surface layer, wherein the reduced copper oxide surface layer comprises copper oxide in a first oxidation state and copper atom;
- and
- oxidizing the reduced copper oxide surface to form a copper oxide surface that is enriched with copper oxide in its higher oxidation state, wherein the enriched copper oxide surface comprises copper oxide in a first oxidation state and copper oxide in a second oxidation state.
Dependencies are inferred from the claim text.