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US 7,396,236 B2Granted
Wafer level interposer
AssigneeFormFactor, Inc.
InventorsBenjamin N. Eldridge, Carl V. Reynolds
Life of this patent
Estimating the term…
Abstract
Double-sided interposer assemblies and methods for forming and using them. In one example of the invention, an interposer comprises a substrate having a first surface and a second surface opposite of said first surface, a first plurality of contact elements disposed on said first side of said substrate, and a second plurality of contact elements disposed on said second surface of said substrate, wherein said interposer connects electronic devices via said first and said second plurality of contact elements.
Claims29
A test apparatus for testing an electronic device, said test apparatus comprising:
- a contactor comprising a first plurality of terminals;
- an interposer comprising:
- a substrate,
- a first plurality of elongate, resilient contact elements extending from a first side of said substrate, and
- a second plurality of contact elements corresponding to a second side of said substrate, ones of said first plurality of contact elements being electrically connected to ones of said second plurality of contact elements;
- and
- means for positioning and attaching said interposer to said contactor such that in testing at least one of said contactor or said interposer is moveable between a first position and a second position while said interposer is positioned close or attached to said contactor, wherein in said first position when said interposer is supported by said contactor, said first plurality of contact elements do not contact said first terminals on said contactor, and in said second position when said interposer is not supported by said contactor, said first plurality of contact elements contact said first terminals on said contactor and said first plurality of contact elements and said second plurality of contact elements provide electrical connections from said first terminals on said contactor to a second plurality of terminals on said electronic device.
4 more elements
A test apparatus for testing an electronic device, said test apparatus comprising:
- a contactor comprising a first plurality of terminals;
- an interposer comprising:
- a substrate,
- a first plurality of elongate, resilient contact elements extending from a first side of said substrate, and
- a second plurality of contact elements corresponding to a second side of said substrate, ones of said first plurality of contact elements being electrically connected to ones of said second plurality of contact elements;
- and
- means for positioning and attaching said interposer to said contactor such that in testing at least one of said contactor or said interposer is moveable between a first position and a second position while said interposer is positioned close or attached to said contactor,
- wherein in said first position when said interposer is supported by said contactor, said first plurality of contact elements do not contact said first terminals on said contactor, and
- in said second position when said interposer is not supported by said contactor, said first plurality of contact elements contact said first terminals on said contactor and said first plurality of contact elements and said second plurality of contact elements provide electrical connections from said first terminals on said contactor to a second plurality of terminals on said electronic device, wherein said interposer is moved from said first position to said second position upon application of forces to ones of said second plurality of contact elements.
6 more elements
A test apparatus for testing an electronic device, said test apparatus comprising:
- a contactor comprising a first plurality of terminals;
- an interposer comprising:
- a substrate,
- a first plurality of elongate, resilient contact elements extending from a first side of said substrate, and
- a second plurality of contact elements corresponding to a second side of said substrate, ones of said first plurality of contact elements being electrically connected to ones of said second plurality of contact elements;
- and
- means for positioning and attaching said interposer to said contactor such that in testing at least one of said contactor or said interposer is moveable between a first position and a second position while said interposer is positioned close or attached to said contactor,
- wherein in said first position when said interposer is supported by said contactor, said first plurality of contact elements do not contact said first terminals on said contactor, and in said second position when said interposer is not supported by said contactor, said first plurality of contact elements contact said first terminals on said contactor and said first plurality of contact elements and said second plurality of contact elements provide electrical connections from said first terminals on said contactor to a second plurality of terminals on said electronic device, wherein said interposer is moved from said first position to said second position in response to ones of said second plurality of terminals on said electronic device being pressed against ones of said second plurality of contact elements.
5 more elements
Dependencies are inferred from the claim text.