Scatter correction for CT method and apparatus
AssigneeGeneral Electric Company
InventorsPeter Michael Edic, Samit Kumar Basu
Life of this patent
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Abstract
A method, system, and machine readable media are provided for correcting scatter in an image. The method comprises sequentially emitting radiation from a subset of radiation sources toward a detector array and measuring radiation on areas of the detector array not exposed to the emitted primary radiation at the time of measurement. Scatter is estimated from the measured radiation. Furthermore, the scatter estimates are subtracted from the measured data and images with improved image quality are reconstructed.
Claims25
A method for correcting scatter in an image, comprising:
- sequentially emitting radiation from a subset of one or more radiation sources toward a detector array;
- measuring radiation on areas of the detector array that are not exposed to the emitted primary radiation at the time of measurement;
- and
- estimating a scatter signal from the measured radiation.
An imaging system, comprising:
- one or more radiation sources along the z-axis, each radiation source configured to emit a beam of radiation;
- a detector array comprising a plurality of detector elements, wherein each detector element may generate one or more signals in response to the respective beams of radiation;
- a system controller configured to control the radiation sources, including activating subsets of the radiation sources sequentially;
- the system controller further configured to acquire the one or more signals from the plurality of detector elements, including detector elements not exposed to the beams of primary radiation at the time of acquisition;
- and
- a computer system configured to estimate scatter over the entire detector array.
One or more tangible, machine readable media, comprising code executable to perform the acts of:
- sequentially emitting radiation from a subset of at least one or more radiation sources toward a detector array;
- measuring radiation on areas of the detector array that are not exposed to the emitted primary radiation at the time of measurement;
- and
- estimating scatter from the measured radiation.
Dependencies are inferred from the claim text.