Methods and apparatus for data analysis
AssigneeTest Advantage, Inc.
InventorsMichael J. Scott, Jacky Gorin, Paul Buxton, Eric Paul Tabor
Life of this patent
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
Claims45
A test data analysis system for analyzing test data for a set of components fabricated and tested using a fabrication process, comprising:
- a memory for storing the test data;
- and
- an outlier identification system having access to the memory and configured to identify outliers in the test data according to a selected outlier identification algorithm, wherein the outlier identification system is configured to automatically select the selected outlier identification algorithm from a plurality of outlier identification algorithms according to a data population type of the test data.
A computer-implemented method for testing components comprising:
- obtaining test data for the components;
- automatically selecting an outlier identification algorithm from a plurality of outlier identification algorithms according to a data population type of the test data;
- and
- automatically identifying outliers in the test data according to the selected outlier identification algorithm.
A medium storing instructions executable by a machine, wherein the instructions cause the machine to execute a method for analyzing test data comprising:
- obtaining test data for the components;
- automatically selecting an outlier identification algorithm from a plurality of outlier identification algorithms according to a data population type of the test data;
- and
- automatically identifying an outlier in the test data using the selected outlier identification algorithm.
Dependencies are inferred from the claim text.