Method and circuit arrangement for the self-testing of a reference voltage in electronic components

Abstract

A method for the self-testing of a reference voltage in electronic components includes a circuit arrangement for a self-test of the reference voltage that can be implemented in the form of an on-chip test, eg., for which no external reference voltage source is required. The reference voltage (Uref) is fed to a voltage-controlled oscillator whose output forms the input to a Wien-Robinson bridge whose output signal is checked in a phase detector for its phase shift relative to the input to the Wien-Robinson bridge to check the balance of the Wien-Robinson bridge. The Wien-Robinson bridge is set to be balanced at a frequency (OMEGAref.test) that is generated in the oscillator at the nominal value(Uref.tes) selected for the reference voltage (Uref), and a pass signal is generated if the bridge is balanced and a fail signal is generated if it is not.

Dependencies are inferred from the claim text.