Runtime-competitive fault handling for reconfigurable logic devices
AssigneeUniversity of Central Florida Research Foundation, Inc.
InventorRonald F. Demara
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AssigneeUniversity of Central Florida Research Foundation, Inc.
InventorRonald F. Demara
Estimating the term…
Methods, systems, apparatus and devices to provide autonomous self-repair for programmable logic. Using Competitive Runtime Reconfiguration, an initial population of functionally identical, yet physically distinct individual programmable logic configurations are produced at design time. During operation, individuals compete for selection based on a fitness function favoring fault-free behavior and any physical resource exhibiting an operationally-significant fault decreases the fitness of those configurations which use it. Through runtime competition, the presence of the fault becomes occluded from the visibility of subsequent operations. Offspring formed through crossover and mutation of faulty and viable configurations are reintroduced into the population to enable evolution of a customized fault-specific repair, realized as new configurations using normal throughput processing operations. In an embodiment, the error detection circuit is also checked for errors.
A programmable logic device with an embedded processor core for executing instructions and memory for storing the instructions and having autonomous fault detection and self-repair capabilities during operation after the configuration process, the programmable logic device further comprising:
A system for autonomous self-repair of reconfigurable logic devices when a fault occurs during operation after the configuration process comprising:
A method for self-repair of reconfigurable logic devices with an embedded processor core for executing instructions and memory for storing the instructions, the testing and self-repair occurring during normal throughput processing operation after the configuration process, the instructions comprising the steps of:
Dependencies are inferred from the claim text.