Knitted sensor

A sensor comprising:

• a first knitted conductive textile plane,
• a second conductive textile plane, and
• an intermediate separating plane penetrable by the first knitted conductive textile plane to allow the first conductive textile plane and the second conductive textile plane to make electrical contact under a mechanical interaction;
• the intermediate separating plane defines the structural perimeter of each of a plurality of apertures from which the first knitted conductive textile plane deforms towards the second conductive textile plane under a mechanical interaction;
• wherein:
• the first knitted conductive textile plane has conductive yam knitted to form a repeating pattern of stitches each comprising a stitch looping portion SLIP having a looping portion footprint LPF,
• the separating plane defines apertures A having an aperture footprint AF,
• at least one looping portion footprint LPF is wholly containable within at least one aperture footprint AF;
• and
• said intermediate separating plane is provided in the form of a textile structure and said intermediate separating plane and said first knitted conductive textile layer are machined together to form a textile structure incorporating a predetermined loop-aperture alignment pattern.