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US 7,356,430 B2Granted
Methods and apparatus for data analysis
AssigneeTest Advantage, Inc.
InventorsEmilio Miguelanez, Michael J. Scott, Jacky Gorin, Paul Buxton, Paul Tabor
Life of this patent
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
Claims19
A test system, comprising:
- a tester configured to test a set of components and generate test data for the set of components;
- a diagnostic system configured to receive the test data from the tester and automatically analyze the test data to identify a problem in a process for fabricating the components, wherein the diagnostic system is configured to recognize a pattern in the test data and match the recognized pattern with the problem, and wherein the diagnostic system includes a classifier configured to classify the pattern using an evolutionary algorithm.
Dependencies are inferred from the claim text.