Wear leveling techniques for flash EEPROM systems
AssigneeSanDisk Corporation
InventorsKarl M. J. Lofgren, Robert D. Norman, Gregory B. Thelin, Anil Gupta
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AssigneeSanDisk Corporation
InventorsKarl M. J. Lofgren, Robert D. Norman, Gregory B. Thelin, Anil Gupta
Estimating the term…
A mass storage system made of flash electrically erasable and programmable read only memory (“EEPROM”) cells organized into blocks, the blocks in turn being grouped into memory banks, is managed to even out the numbers of erase and rewrite cycles experienced by the memory banks in order to extend the service lifetime of the memory system. Since this type of memory cell becomes unusable after a finite number of erase and rewrite cycles, although in the tens of thousands of cycles, uneven use of the memory banks is avoided so that the entire memory does not become inoperative because one of its banks has reached its end of life while others of the banks are little used. Relative use of the memory banks is monitored and, in response to detection of uneven use, have their physical addresses periodically swapped for each other in order to even out their use over the lifetime of the memory.
A method of managing operation of an EEPROM mass storage system divided into a number of groups of memory cells which are periodically rewritten with new data, comprising the steps of:
A non-volatile memory system of a type having an array of EEPROM cells arranged in a plurality of separately addressable and erasable blocks of cells, comprising:
A non-volatile memory system of a type having an array of EEPROM cells arranged in a plurality of separately addressable and erasable blocks of cells, comprising:
Dependencies are inferred from the claim text.