Measurement system optimization
AssigneeInternational Business Machines Corporation
InventorsCharles N. Archie, George W. Banke, Jr., Eric P. Solecky
Life of this patent
Estimating the term…
Abstract
Optimizing a measurement system under test (MSUT) is disclosed. In one embodiment, a method includes selecting a first set of adjustable parameters of the MSUT that affect a quality metric for the MSUT, calculating the quality metric over a range of values of each adjustable parameter in the first set of adjustable parameters, generating a first multidimensional response space based on the calculating step, and determining which value of each adjustable parameter optimizes the quality metric based on the first multidimensional response space. The multidimensional response space may be stored for later recall for other optimization exercises.
Claims27
A method of optimizing a measurement system under test (MSUT), the method comprising:
- selecting a first set of three adjustable parameters of the MSUT that affect a quality metric for the MSUT;
- calculating the quality metric over a range of values of each adjustable parameter in the first set of adjustable parameters;
- generating a first three-dimensional response space based on the calculating step;
- determining which value of each adjustable parameter optimizes the quality metric based on the first three-dimensional response space;
- and
- conveying each value.
A system for optimizing a measurement system under test (MSUT), the system comprising:
- a calculator for calculating a quality metric for the MSUT over a range of values of each adjustable parameter in a first set of three adjustable parameters that affect the quality metric;
- a generator for generating a first three-dimensional response space based on the calculating step;
- and
- a determinator for determining which value of each adjustable parameter optimizes the quality metric based on the first three-dimensional response space.
A program product stored on a computer-readable medium, which when executed, optimizes a measurement system under test (MSUT), the program product comprising:
- program code for calculating a quality metric for the MSUT over a range of values of each adjustable parameter in a first set of three adjustable parameters that affect the quality metric;
- program code for generating a first three-dimensional response space based on the calculating step;
- program code for determining which value of each adjustable parameter optimizes the quality metric based on the first three-dimensional response space;
- and
- program code for conveying each value.
A method of optimizing a measurement system under test (MSUT), the method comprising:
- selecting a first set of three adjustable parameters of the MSUT that affect a quality metric for the MSUT;
- measuring a set of process stressed artifacts over the range of values of each adjustable parameter in the first set of three adjustable parameters;
- calculating the quality metric for each measurement;
- generating a first three-dimensional response space based on the calculating step;
- obtaining a second three-dimensional response space that is based on a second set of adjustable parameters;
- determining which value of each adjustable parameter in the first three-dimensional response space and the second three-dimensional response space optimizes the quality metric;
- and
- conveying each value.
Dependencies are inferred from the claim text.