Optical recording medium having relation between reflection layer and pit length
AssigneeRicoh Company, Ltd.
InventorsKatsuyuki Yamada, Shinya Narumi
Life of this patent
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Abstract
An optical information recording medium including a substrate, a light absorbing layer which is located overlying the substrate and in which marks are formed to store information and a light reflection layer located overlying the light absorbing layer including a crystal, wherein the optical information recording medium satisfies the relationship, Lt/4 ≦Lc≦ Lm, wherein Lc represents the average particle diameter of the crystal of the light reflection layer, Lm represents the minimum length of the marks, and Lt represents the thickness of the light reflection layer.
Claims4
An optical information recording medium comprising:
- a substrate;
- a dye-type light absorbing layer which is located overlying the substrate and in which marks are formed to store information;
- and
- a light reflection layer which is located overlying the light absorbing layer and which comprises a crystal, wherein the light reflection layer has a thickness,
- wherein the optical information recording medium satisfies the following relationship:
- Lt/4≦Lc ≦Lm,
- wherein Lc represents an average particle diameter of the crystal of the light reflection layer;
- Lm represents a minimum length of the marks formed in the light absorbing layer and is not greater than 0.4 μm;
- and Lt represents the thickness of the light reflection layer;
- and
- wherein the light reflection layer comprises Ag having a purity not less than 99% by weight and includes at least one metal having a normal electrode potential less than that of Ag in an amount of from 0.00005 to 0.005% by weight based on weight of Ag included in the light reflection layer.
An information recording method comprising:
- applying light irradiation to an optical information recording medium to form marks therein, with a minimum mark length Lm, said optical information recording medium comprising a substrate, a dye-type light absorbing layer overlying the substrate and in which said marks are formed to store information, and a light reflection layer having a thickness Lt overlying the light absorbing layer and comprising crystals with an average particle diameter Lc such that Lt/4≦Lc ≦Lm, wherein Lm is not greater than 0.4 μm, wherein said crystals have grain boundaries, wherein said light reflection layer comprises Ag having a purity not less than 99% by weight and includes at least one metal having a normal electrode potential less than that of Ag in an amount of from 0.00005 to 0.005% by weight based on weight of Ag in the light reflection layer, and wherein said at least one metal is present at least at grain boundaries of crystals in the light reflection layer.
Dependencies are inferred from the claim text.