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US 7,352,677 B2Granted
Probe-base storage apparatus having redundancy cantilevers
AssigneeLG Electronics Inc.
InventorYoung Sik Kim
Life of this patent
Estimating the term…
Abstract
A header of a nano storing apparatus is disclosed. If some cantilevers of the header are defective, an additional extra cantilever array is substitutively used. The header of a nano storing apparatus including: a cantilevery array including cantilevers each having a probe that is able to read and write information of the ‘n’ number of rows and the ‘m’ number of columns, an X-redundancy cantilever array to be used as a substitute when cantilever probes of a specific row in the cantilever array are defective; a Y-redundancy cantilever array to be used as a substitute when cantilever probes of a specific column in the cantilever array are defective; and a header controller for controlling each part.
Claims10
A storage apparatus comprising:
- a cantilevery array cantilever probes;
- an X-redundancy cantilever array configured to read and write information when at least one cantilever probe of a specific row in the cantilever array is defective;
- a Y-redundancy cantilever array configured to read and write information when at least one cantilever probe of a specific column in the cantilever array is defective;
- and
- a redundancy cantilever array controller configured to determine that a corresponding cantilever probe is defective when the corresponding cantilever probe is unable to read and write information, and configured to select the X-redundancy cantilever array and the Y-redundancy cantilever array when the at least one cantilever probe of the specific row and of the specific column in the cantilever array is defective,
- wherein the redundancy cantilever controller comprises:
- an X-decoder configured to receive an X-address signal and to drive cantilevers of the specific row in the cantilever array;
- an X-redundancy decoder configured to stop driving the X-decoder when the at least one cantilever probe of the specific row in the cantilever array is defective and to select the X-redundancy cantilever array;
- a Y-decoder configured to receive an Y-address signal and selectively drive the specific column in the cantilever array;
- and
- a Y-redundancy decoder for configured to stop driving the Y-decoder when the at least one cantilever probe of the specific column in the cantilever array is defective, and to select the Y-redundancy cantilever array, and
- wherein the X-redundancy decoder comprises:
- an output terminal configured to output a stop signal to the X-decoder when the at least one cantilever probe of the specific row in the cantilever array is defective;
- a high voltage unit configured to transfer a high voltage (VCC) to the output terminal by a specific pulse signal (XRP);
- a low voltage unit configured to receive the X-address signal and to output a low voltage (0V) to the output terminal;
- and
- a plurality of fuses connected between the output terminal and the low voltage unit and to selectively defuse when the at least one cantilever probe of the specific row in the cantilever array is defective.
14 more elements
The apparatus of 1, wherein the X-redundancy decoder stops driving the X-decoder when the X-redundancy cantilever array is selected.
A storage apparatus comprising:
- a cantilevery array cantilever probes;
- an X-redundancy cantilever array configured to read and write information when at least one cantilever probe of a specific row in the cantilever array is defective;
- a Y-redundancy cantilever array configured to read and write information when at least one cantilever probe of a specific column in the cantilever array is defective;
- and
- a redundancy cantilever array controller configured to determine that a corresponding cantilever probe is defective when the corresponding cantilever probe is unable to read and write information, and configured to select the X-redundancy cantilever array and the Y-redundancy cantilever array when the at least one cantilever probe of the specific row and of the specific column in the cantilever array is defective,
- wherein the redundancy cantilever controller comprises:
- an X-decoder configured to receive an X-address signal and to drive cantilevers of the specific row in the cantilever array;
- an X-redundancy decoder configured to stop driving the X-decoder when the at least one cantilever probe of the specific row in the cantilever array is defective and to select the X-redundancy cantilever array;
- a Y-decoder configured to receive an Y-address signal and selectively drive the specific column in the cantilever array;
- and
- a Y-redundancy decoder for configured to stop driving the Y-decoder when the at least one cantilever probe of the specific column in the cantilever array is defective, and to select the Y-redundancy cantilever array, and
- wherein the Y-redundancy decoder comprises:
- an output terminal configured to output a stop signal to the Y-decoder when the at least one cantilever probe in the specific column in the cantilever array is defective;
- a high voltage unit configured to output a high voltage (VCC) to the output terminal by a specific pulse signal (YRP);
- a low voltage unit configured to receive a Y-address signal and outputting a low voltage (0V);
- and
- a plurality of fuses connected between the output terminal and the low voltage unit, and to selectively defuse when the at least one cantilever probe of a the specific column in the cantilever array is defective.
14 more elements
Dependencies are inferred from the claim text.