Fourier transform spectrometry with a single-aperture interferometer
AssigneeLockheed Martin Corporation
InventorsRichard Lee Kendrick, Eric H. Smith
Life of this patent
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Abstract
A spectrometer that implements the functionality of a Fizeau interferometer, the spectrometer including a collection device that is configured to collect a wavefront, a deformable mirror disposed at an image plane of the collection device, the deformable mirror having a plurality of sections, at least one of which is deformed to form interference patterns on the wavefront at the image plane, and a Fourier transformation module configured to derive spectral information from the interference patterns.
Claims25
A spectrometer comprising:
- a collection device that is configured to collect a wavefront, the collection device having an entrance pupil;
- a deformable mirror disposed at an image of the entrance pupil, the deformable mirror having a plurality of sections, at least one of which is deformed to form interference patterns at an image plane of the collection device;
- and
- a Fourier transformation module configured to derive spectral information from the interference patterns.
A method for deriving a spectral information from a wavefront, the method comprising the steps of:
- collecting a wavefront with a collection device, the collection device having an entrance pupil;
- interfering the collected wavefront with a deformable mirror disposed at an image of the entrance pupil to form interference patterns at an image plane of the collection device, the deformable mirror having a plurality of sections, at least one of which is deformed;
- and
- Fourier transforming the interference patterns to derive spectral information for the wavefront.
Dependencies are inferred from the claim text.