Method and apparatus for detecting materials
AssigneesRiken, S-I Seiko Co., Ltd.
InventorsKodo Kawase, Yuuki Watanabe, Tomofumi Ikari
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Abstract
An apparatus for detecting materials includes a database for storing detecting spectra of detecting materials, and a tera-hertz wave applying unit for applying tera-hertz waves having a plurality of different frequencies around a boundary between a light wave frequency and a radio wave frequency, to a predetermined position of an inspecting object. The apparatus includes an output wave receiving unit for receiving an output wave that is the tera-hertz wave having been applied to the inspecting object, and a determining unit for determining whether or not the output wave includes the detecting spectrum.
Claims5
A method for detecting materials, comprising the steps of:
- applying tera-hertz waves of a plurality of different frequencies around a boundary between a light wave frequency and a radio wave frequency to a predetermined position of an inspecting object by using a tera-hertz wave applying means;
- and
- detecting the presence or absence of a detecting material by determining whether or not an output wave includes a detecting spectrum of the detecting material, wherein the output wave is the tera-hertz wave that has been applied to the inspecting object,
- wherein the tera-hertz wave applying means includes white light applying means for applying white light of a plurality of different frequencies to the inspecting object, and wherein a spectrum obtaining means for performing Fourier transformation on the output wave to obtain a spectrum formed by the respective different frequencies is used to receive the output wave and to determine whether or not the output wave includes the detecting spectrum of the detecting material.
An apparatus for detecting materials, comprising:
- a database for storing detecting spectra of detecting materials;
- tera-hertz wave applying means for applying tera-hertz waves having a plurality of different frequencies around a boundary between a light wave frequency and a radio wave frequency, to a predetermined position of an inspecting object;
- output wave receiving means for receiving an output wave that is the tera-hertz wave having been applied to the inspecting object;
- and
- determining means for determining whether or not the output wave includes the detecting spectrum,
- wherein the tera-hertz wave applying means includes white light applying means for applying white light of a plurality of different frequencies to the inspecting object,
- and the apparatus further includes spectrum obtaining means for performing Fourier transformation on the output wave to obtain a spectrum formed by the respective different frequencies.
Dependencies are inferred from the claim text.