Calibration apparatus, calibration method, and testing apparatus
AssigneeAdvantest Corporation
InventorMasahiro Ishida
Life of this patent
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AssigneeAdvantest Corporation
InventorMasahiro Ishida
Estimating the term…
A jitter measuring circuit includes a jitter signal generating section that generates a jitter signal, and an integrating section that charges and discharges a capacitor with a predetermined electric current according to the jitter signal to integrate the jitter signal and outputs a jitter measuring signal with a level according to an amount of jitter in the input signal. A calibration apparatus includes a current control section that makes the integrating section output at least one of a predetermined charging current and a predetermined discharging current for charging and discharging the capacitor, a voltage measuring section that measures voltage variation of the capacitor in a state where the charging current or the discharging current is output by the current control section, and a gain computing section that computes gain of the integrating section based on the voltage variation measured by the voltage measuring section.
A calibration apparatus that calibrates a jitter measuring circuit, the jitter measuring circuit comprising:
A calibration method for calibrating a jitter measuring circuit, the jitter measuring circuit comprising:
A testing apparatus that tests a device under test, comprising:
Dependencies are inferred from the claim text.