Adjusting manufacturing process control parameter using updated process threshold derived from uncontrollable error
AssigneeApplied Materials, Inc.
InventorYoung J. Paik
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AssigneeApplied Materials, Inc.
InventorYoung J. Paik
Estimating the term…
A method, system and medium are provided for enabling improved feedback and feedforward control. An error, or deviation from target result, is observed during manufacture of semi conductor chips. The error within standard deviation is caused by two components: a white noise component and a signal component (such as systematic errors). The white noise component is random noise and therefore is relatively non-controllable. The systematic error, in contrast, may be controlled by changing the control parameters. A ratio between the two components is calculated autoregressively. Based on the ratio and using the observed or measured error, the actual value of the error caused by the signal component is calculated utilizing an autoregressive stochastic sequence. The actual value of the error is then used in determining when and how to change the control parameters. The autoregressive stochastic sequence addresses the issue of real-time control of the effects of run-to-run deviations, and provides a mechanism that can extract white noise from the statistical process variance in real time. This results in an ability to provide tighter control of feedback and feedforward variations.
A computer-implemented method for controlling a manufacturing process, comprising the steps of:
A computer program product for controlling a manufacturing process, the computer program product comprising:
A system for controlling a manufacturing process, comprising:
Dependencies are inferred from the claim text.