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US 7,340,358 B2Granted
Measurement equipment
AssigneeYokogawa Electric Corporation
InventorToshiaki Yoneyama
Life of this patent
Estimating the term…
Abstract
A measurement equipment has a polygonal line processing section and a computational processing section. The polygonal line processing section produces a polygonal line pattern signal based on a predetermined polygonal line pattern having a polygonal line value that varies according to a polygonal line time and a timer processing for the polygonal line time. The computational processing section executes a computational processing with using an external input signal and the polygonal line pattern signal.
Claims3
A Measurement equipment comprising,
- a polygonal line processing section which produces a polygonal line pattern signal based on a specified polygonal line pattern having a polygonal line value that varies according to a polygonal line time and a timer processing for the polygonal line time;
- and
- a computational processing section which executes computational processing using an external input signal and the polygonal line pattern signal,
- wherein the polygonal line processing section comprises:
- a polygonal line setting section which stores polygonal line setting information showing a relationship between the polygonal line value and the polygonal line time of the polygonal line pattern;
- a polygonal line timer processing section which controls a lapse of the polygonal line time;
- and
- a polygonal line producing section which produces the polygonal line pattern signal based on the polygonal line setting information obtained from the polygonal line setting section and the timer processing by the polygonal line timer processing section, and
- wherein the polygonal line setting information is a table which defines a polygonal line time set value and a polygonal line value set value correlated with the polygonal line time set value.
6 more elements
Dependencies are inferred from the claim text.