Device and method for measuring components

A method for measuring components using a measurement system guided by a manipulator,

• whereby reference features are decentrally located at various positions close to a component to be measured, the reference features each being assigned to at least one test object located at a close distance to the relevant reference feature to be measured,
• whereby, before a test object is measured, the measurement system is first brought into a calibration position using the manipulator,
• whereby the reference feature assigned to the particular test object is measured using the measuring system to calibrate a coordinate system of the manipulator,
• whereby the measurement system is then moved via the manipulator into a measurement position which is located next to the calibration position, whereby the particular test object is measured in the calibration position, to measure point and lines extending into space and entire surfaces of the component,
• wherein, to measure the test objects of the component with the manipulator fixed in place, the measurement system is located on the manipulator such that it is linearly movable along a measurement system axis and/or pivotable around a measurement system axis and, during calibration, the position of the measurement system axis is determined in a coordinate system that is fixed relative to the reference feature.

The device for measuring components, with

• a manipulator,
• a measurement system located on the manipulator such that the measurement system is movable in space via the manipulator,
• a number of reference features decentrally located at various positions close to a component to be measured, the reference features each being assigned to at least one test object that is located at a close distance to the particular reference feature to be measured,
• and a control device designed such that the measurement system is first brought into a calibration position using the manipulator before a test object is measured, and the reference feature assigned to the particular test object is measured using the measurement system to calibrate a coordinate system of the manipulator,
• and the measurement system is then moved into a measurement position using the manipulator, which is located next to the calibration position and in which the particular test object is measured.

Component carrier for use in a method for measuring components using a measurement system guided by a manipulator,

• whereby reference features are decentrally located at various positions close to a component to be measured, the reference features each being assigned to at least one test object located at a close distance to the relevant reference feature to be measured,
• and, whereby, before a test object is measured, the measurement system is first brought into a calibration position using the manipulator, and the reference feature assigned to the particular test object is measured using the measuring system to calibrate a coordinate system of the manipulator,
• the measurement system is then moved via the manipulator into a measurement position which is located next to the calibration position, and the particular test object is measured in the calibration position, to measure point and lines extending into space and entire surfaces of the component, the component carrier comprising
• means for holding a component in a defined position on the component carrier,
• and a number of reference features and/or reference feature fixing elements for securing corresponding reference features to the component carrier located in defined various positions on the component carrier close to a positioned component.

The device for measuring components, with

• a manipulator,
• a measurement system located on the manipulator such that the measurement system is movable in space via the manipulator,
• a number of reference features decentrally located at various positions close to a component to be measured, the reference features each being assigned to at least one test object that is located at a close distance to the particular reference feature to be measured,
• and a control device designed such that the measurement system is first brought into a calibration position using the manipulator before a test object is measured, and the reference feature assigned to the particular test object is measured using the measurement system to calibrate a coordinate system of the manipulator,
• and the measurement system is then moved into a measurement position using the manipulator, which is located next to the calibration position and in which the particular test object is measured
• wherein, to measure the test objects of the component with the manipulator fixed in place, the measurement system is located on the manipulator such that it is linearly movable along a measurement system axis and/or pivotable around a measurement system axis and, during calibration, the position of the measurement system axis is determined in a coordinate system that is fixed relative to the reference feature.