Self-referencing instrument and method thereof for measuring electromagnetic properties
AssigneeActon Research Corporation
InventorJames A. McCandless
Life of this patent
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AssigneeActon Research Corporation
InventorJames A. McCandless
Estimating the term…
In a self-referencing instrument for measuring electromagnetic radiation, a mounting member to which a sample can be coupled moves the sample such that, in a first position, the electromagnetic radiation impinges on the sample, and, in a second position, the electromagnetic radiation does not impinge on the sample. A detection unit receives the electromagnetic radiation from the sample and generates a sample signal when the sample is in the first position, and the detection unit receives the electromagnetic radiation from the source and generates a reference signal when the sample is in the second position. A processor coupled to the detection unit processes the reference signal and the sample signal. This results in a continuous, accurate reference measurement, and permits the instrument to efficiently compensate for error, while offering accurate measurements.
A self-referencing instrument for measuring properties of electromagnetic radiation, comprising:
Dependencies are inferred from the claim text.